International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 
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TC 47 Working Documents since 2019-07-16

Reference, Title
Downloads

Circulation

Date

Closing

Date

CENELEC

Voting /

Comment

Of interest to

Committees

47/2644/RVD

Result of Voting on 47/2633/FDIS - IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

2020-07-10 Y
TC 91
TC 101
TC 104
47/2642/RQ

Result of Questionnaire on 47/2632/Q: Merging WG 2 with WG 3 and nomination of co-onvenor in  47/ 2

2020-07-03 N/A
47/2643/RVD

Result of Voting on 47/2631/FDIS - IEC 60749-41 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

2020-07-03 Y
47/2637/RVD

Result of Voting on 47/2627/FDIS - IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

2020-06-26 N
TC 91
TC 104
47/2638/RVD

Result of Voting on 47/2628/FDIS - IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2020-06-26 N
TC 91
TC 104
47/2639/RVD

Result of Voting on 47/2630/FDIS - IEC 60749-15 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

2020-06-26 Y
47/2640/RVN

Result of Voting on 47/2610/NP - PNW 47-2610: Future IEC 62951-9: Semiconductor devices - Flexible and strechable semiconductor devices – Part 9: Performance and reliability testing methods of  one transistor and one resistor (1T1R) resistive memory cells

2020-06-26 N
TC 124
47/2641/RVN

Result of Voting on 47/2594/NP - PNW 47-2594: Semiconductor devices - Semiconductor devices for IoT-based fire detection system– Part 1: Test method of semiconductor devices for IoT-based sound variation fire detection system

2020-06-26 U
ISO/IEC JTC 1/SC 41
47/2633(F)/FDIS

IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

2020-06-19 2020-07-03 Y
TC 91
TC 101
TC 104
47/2634(F)/FDIS

IEC 60749-20 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

2020-06-19 2020-07-10 Y
47/2636/CC

Compilation of Comments on 47/2592/CD - IEC 63244-1 ED1: Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : General requirements and specifications

2020-06-19 Y
47/2631(F)/FDIS

IEC 60749-41 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

2020-06-05 2020-06-26 Y
47/2630(F)/FDIS

IEC 60749-15 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

2020-05-29 2020-06-19 Y
47/2634/FDIS

IEC 60749-20 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

2020-05-29 2020-07-10 Y Voting Result
47/2635/NP

PNW 47-2635: Semiconductor devices – Guidelines for reliability qualification plans – Part 2: Concept of Mission profile

2020-05-29 2020-08-21 U
47/2633/FDIS

IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

2020-05-22 2020-07-03 Y Voting Result
TC 91
TC 101
TC 104
47/2631/FDIS

IEC 60749-41 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

2020-05-15 2020-06-26 Y Voting Result
47/2632/Q

Merging WG 2 with WG 3 and nomination of co-convenor in TC 47 / WG 2  

2020-05-15 2020-06-26 N/A Report of Comments
47/2630/FDIS

IEC 60749-15 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

2020-05-08 2020-06-19 Y Voting Result
47/2621/CDV

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

2020-05-01 2020-07-24 N
TC 91
TC 104
47/2627/FDIS

IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

2020-05-01 2020-06-12 N Voting Result
TC 91
TC 104
47/2628/FDIS

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2020-05-01 2020-06-12 N Voting Result
TC 91
TC 104
47/2629/RVC

Result of Voting on 47/2562/CDV - IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

2020-05-01 Y
TC 91
TC 101
TC 104
47/2625/RR

Review report of IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

2020-04-17 Y
TC 91
TC 101
TC 104
47/2626/RVC

Result of Voting on 47/2563/CDV - IEC 60749-20 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat

2020-04-17 Y
47/2622/CD

IEC 63275-1 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

2020-03-27 2020-06-19 Y Report of Comments
TC 91
TC 104
47/2623/CD

IEC 63275-2 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating

2020-03-27 2020-06-19 Y Report of Comments
TC 91
TC 104
47/2624/CD

IEC 63284 ED1: Semiconductor devices - Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors

2020-03-27 2020-06-19 Y Report of Comments
TC 91
TC 104
47/2614/CDV

IEC 63287-1 ED1: Semiconductor devices – Generic semiconductor qualification guidelines – Part 1: Guidelines for LSI reliability qualification

2020-03-06 2020-05-29 Y Voting Result
47/2619/RVC

Result of Voting on 47/2588/CDV - IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2020-03-06 N
TC 91
TC 104
47/2620/CC

Compilation of Comments on 47/2599/CD - IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

2020-03-06 N
TC 91
TC 104
47/2618/RVC

Result of Voting on 47/2595/CDV - IEC 62435-8 ED1: Electronic components – Long-term storage of electronic semiconductor devices – Part 8: Passive electronic devices

2020-02-21 Y
TC 40
TC 107
47/2617/NP

PNW 47-2617: Future IEC 62435-9: Electronic components – Long-term storage of electronic semiconductor devices - Part 9: Special Cases

2020-01-24 2020-04-17 U Voting Result
TC 107
47/2615/RVD

Result of Voting on 47/2608/FDIS - IEC 62435-3 ED1: Electronic components – Long-term storage of electronic semiconductor devices – Part 3: Data

2020-01-17 Y
TC 107
47/2616/RVC

Result of Voting on 47/2584/CDV - IEC 60749-41 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

2020-01-17 Y
47/2613A/RR

Review report of IEC 60749-43 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plans

2020-01-10 Y
47/2612/RVN

Result of Voting on 47/2578/NP - PNW 47-2578: Semiconductor devices - Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors

2020-01-03 Y
TC 91
TC 104
47/2613/RR

Replaced by 47/2613A/RR

2020-01-03 Y
47/2611/RVD

Result of Voting on 47/2600/FDIS - IEC 62779-4 ED1: Semiconductor devices - Semiconductor interface for human body communication- Part 4: Capsule endoscope

2019-12-27 Y
SC 62D
47/2610/NP

PNW 47-2610: Future IEC 62951-9: Semiconductor devices - Flexible and strechable semiconductor devices – Part 9: Performance and reliability testing methods of  one transistor and one resistor (1T1R) resistive memory cells

2019-12-06 2020-02-28 N Voting Result
TC 124
47/2608/FDIS

IEC 62435-3 ED1: Electronic components – Long-term storage of electronic semiconductor devices – Part 3: Data

2019-11-29 2020-01-10 Y Voting Result
TC 107
47/2609/RVC

Result of Voting on 47/2545/CDV - IEC 62830-5 ED1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 5: Test method for measuring generated power from flexible thermoelectric devices

2019-11-29 N
47/2607/RVC

Result of Voting on 47/2570/CDV - IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI Test for MOSFET

2019-11-22 N
TC 91
TC 104
47/2595/CDV

IEC 62435-8 ED1: Electronic components – Long-term storage of electronic semiconductor devices – Part 8: Passive electronic devices

2019-11-15 2020-02-07 Y Voting Result
TC 40
TC 107
47/2602/DL

List of decisions taken at the meeting of TC 47, held in Shanghai, China on 18 October, 2019

2019-11-15 N/A
47/2603/RM

Unconfirmed minutes of TC 47 plenary meeting held in Shanghai, China on 2019-10-18

2019-11-15 N/A
47/2604/RVC

Result of Voting on 47/2575/CDV - IEC 60749-15 ED3: Semiconductor devices - Mechanical and climatic test methods - Part 15: Resistance to soldering temperature for through-hole mounted devices

2019-11-15 Y
47/2605/RVN

Result of Voting on 47/2576A/NP - PNW 47-2576: Semiconductor devices - Reliability test method for silicon carbide descrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

2019-11-15 Y
TC 91
TC 104
47/2606/RVN

Result of Voting on 47/2577A/NP - PNW 47-2577: Semiconductor devices - Reliability test method for silicon carbide descrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating

2019-11-15 Y
TC 91
TC 104
47/2600/FDIS

IEC 62779-4 ED1: Semiconductor devices - Semiconductor interface for human body communication- Part 4: Capsule endoscope

2019-11-08 2019-12-20 Y Voting Result
SC 62D
47/2601/CD

IEC 62830-8 ED1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 8- Test and evaluation methods of flexible and stretchable supercapacitors for use in low power electronics

2019-11-08 2020-01-31 N Report of Comments
TC 124
47/2597/RVC

Result of Voting on 47/2555/CDV - IEC 62435-7 ED1: Long-term storage of electronic components – Part 7: Micro-electromechanical devices

2019-10-11 Y
SC 47F
47/2598/AC

Next meeting of TC 47 and its Subcommittees 47A, 47D, 47E and 47F to be held in Frankfurt, Germany from 16 to 20 November 2020 (online registration)

2019-10-11 N/A
47/2599/CD

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

2019-10-11 2020-01-03 N Report of Comments
TC 91
TC 104
47/2596/NP

PNW 47-2596: Future IEC 62951-8: Semiconductor devices - Flexible and strechable semiconductor devices – Part 8: Test method for stretchability, flexibility, and stability of flexible resistive memory

2019-10-04 2019-12-27 N Voting Result
TC 124
47/2588/CDV

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2019-09-27 2019-12-20 N Voting Result
TC 91
TC 104
47/2594/NP

PNW 47-2594: Semiconductor devices - Semiconductor devices for IoT-based fire detection system– Part 1: Test method of semiconductor devices for IoT-based sound variation fire detection system

2019-09-27 2019-12-20 U Voting Result
ISO/IEC JTC 1/SC 41
47/2593/CC

Compilation of Comments on 47/2528/CD - IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

2019-09-20 N
TC 91
TC 104
47/2592/CD

IEC 63244-1 ED1: Semiconductor devices - Semiconductor devices for wireless power transfer and charging - Part 1 : General requirements and specifications

2019-09-13 2019-12-06 Y Report of Comments
47/2582A/DA

Revised draft agenda for the TC 47 meeting to be held in Shanghai, China on 2019-10-18 (09:00 – 12:00)

2019-09-06 N/A
47/2589/AC

Next meeting of TC 47 and its Subcommittees 47A, 47D, 47E and 47F to be held in Frankfurt, Germany from 16 to 20 November 2020 (announcement)

2019-09-06 N/A
47/2590/INF

Review of Active Participation of P-members in the Work of TC 47

2019-09-06 N/A
47/2591/INF

Comments received on 47/2586/DC: Review and Maintenance – call for comments/ proposals on publications coming up for review and a call for experts

2019-09-06 N/A
47/2584/CDV

IEC 60749-41 ED1: Semiconductor devices - Mechanical and climatic test methods - Part 41: Standard reliability testing methods of non-volatile memory devices

2019-08-23 2019-11-15 Y Voting Result
47/2576A/NP

PNW 47-2576: Semiconductor devices - Reliability test method for silicon carbide descrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

2019-07-19 2019-08-09 Y Voting Result
TC 91
TC 104
47/2577A/NP

PNW 47-2577: Semiconductor devices - Reliability test method for silicon carbide descrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating

2019-07-19 2019-08-09 Y Voting Result
TC 91
TC 104
47/2580/CDV

IEC 62830-7 ED1: Semiconductor devices - Semiconductor devices for energy harvesting and generation - Part 7- Linear sliding mode triboelectric energy harvesting

2019-07-19 2019-10-11 N Voting Result
TC 124
47/2587/RVC

Result of Voting on 47/2524/CDV - IEC 62779-4 ED1: Semiconductor devices - Semiconductor interface for human body communication- Part 4: Semiconductor interface for capsule endoscopy using human body communication

2019-07-19 Y
SC 62D