TC 113 |
Nanotechnologies relatives aux appareils et systèmes électrotechnologiques |

Label |
Titre |
---|---|
WG | |
WG 3 | Evaluation de la performance |
WG 7 | Fiabilité |
WG 8 | Graphene related materials/Carbon nanotube materials |
WG 9 | Nano-Enabled Photovoltaics Thin Film Organic/Nano Electronics, Nanoscale |
WG 10 | Luminescent nanomaterials |
WG 11 | Nano-enabled energy storage |
Equipes de projet | |
PT 62607-2-4 | Nanomanufacturing - Key control characteristics - Part 2-4: Carbon nanotube materials – Accuracy and repeatability of test methods for determination of resistance of carbon nanotubes |
PT 62607-3-3 | Nanomanufacturing - Key control characteristics - Luminescent nanomaterials - Determination of fluorescence lifetime |
PT 62607-4-8 | Nanomanufacturing - Key control characteristics – Part 4-8: Nano-enabled electrical energy storage devices - Determination of water content for electrode nanomaterials by the Karl Fischer Method |
PT 62607-5-2 | Nanomanufacturing - Key control characteristics - Part 5-2: Thin-film organic/nano electronic devices - Measuring Alternating Current characteristics |
PT 62607-5-3 | Nanomanufacturing – Key control characteristics - Part 5-3: Thin-film organic/nano electronic devices – Measurements of charge carrier concentration |
PT 62607-6-1 | Nanofabrication - Caractéristiques de contrôle clé – Partie 6-1: Graphène – Caractérisation électrique |
PT 62607-6-2 | Nanofabrication - Caractéristiques de contrôle clé – Partie 6-2: Graphène – Evaluation du nombre de couches de graphène |
PT 62607-6-5 | Nanomanufacturing - Key control characteristics - Part 6-5: Graphene - Sheet resistance and contact resistance of two-dimensional materials including graphene |
PT 62607-6-6 | Nanomanufacturing - Key control characteristics - Part 6-6: Graphene - Uniformity of strain in graphene analyzed by Raman spectroscopy |
PT 62607-6-9 | Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene - Measurement of sheet resistance by the non-contact Eddy current method |
PT 62607-6-11 | Nanomanufacturing - Key control Characteristics - Part 6-11: Graphene materials - Defect level of graphene films: Raman spectroscopy |
PT 62607-6-13 | Nanomanufacturing – Key control characteristics – Part 6-13: Determination of Oxygen Functional Groups Content of Graphene Materials with Boehm titration method |
PT 62607-6-14 | Nanomanufacturing – Key control characteristics – Part 6-14: Graphene –Defect level analysis in graphene powder using Raman spectroscopy |
PT 62607-7-2 | Nanomanufacturing - Key Control Characteristics - Part 7-2: Nano-enabled photovoltaics - Device evaluation method for indoor light |
PT 62607-8-2 | IEC TS 62607-8-2: Nanomanufacturing - Key control Characteristics - Part 8-2: Nano-enabled metal-oxide interfacial devices - Test method for the polarization properties by thermally stimulated depolarization current |
PT 62607-9-1 | Nanomanufacturing – Key Control Characteristics – Part 9-1: Spatially resolved magnetic field measurements – Magnetic Force Microscopy |
PT 62876-3-1 | NanomanufacturinReliability assessment - Part 3.1: Graphene - Stability test: Temperature and humidity |
PT 80004-12 | ISO TS 80004-12 Nanotechnologies - Vocabulary - Part 12: Quantum phenomena in |
Equipes de maintenance | |
MT 62607-4 | Nanofabrication - Caractéristiques de contrôle clé – Partie 4-1 : Stockage de l’énergie électrique permis par les nanotechnologies |
MT 62632 | Nanoscale electrical contacts and interconnects |
Groupe de travail mixte | |
JWG 1 | Terminology and nomenclature lié(e) à ISO/TC 229 |
JWG 2 | Measurement and characterization lié(e) à ISO/TC 229 |
AG | |
AG 4 | Chairman Advisory Group |
Groupe Ad-Hoc | |
ahG 12 | Electromagnetic Compatibility |
ahG 13 | Wafer-Scale System Integration |
JPT | |
JPT 62565-3-1 | Nanomanufacturing - Material specifications - Part 3-1: Graphene - Blank detail specification |
JPT 62607-6-3 | Nanomanufacturing - Key control characteristics - Part 6-3: Graphene-Characterization of CVD graphene domains |
Pays | Code Pays | P/O Statut | IEC Participation |
---|---|---|---|
AR | O-Member | Membre | |
AU | P-Member | Membre | |
AT | O-Member | Membre | |
BY | O-Member | Membre | |
BE | O-Member | Membre | |
BR | O-Member | Membre | |
BG | P-Member | Membre | |
CA | P-Member | Membre | |
CN | P-Member | Membre | |
CZ | O-Member | Membre | |
DK | O-Member | Membre | |
FI | P-Member | Membre | |
FR | O-Member | Membre | |
DE | P-Member | Membre | |
HU | O-Member | Membre | |
IN | O-Member | Membre | |
ID | O-Member | Membre | |
IR | P-Member | Membre | |
IT | P-Member | Membre | |
JP | P-Member | Membre | |
KR | P-Member | Membre | |
MY | P-Member | Membre | |
MX | O-Member | Membre | |
NL | O-Member | Membre | |
NO | P-Member | Membre | |
PL | O-Member | Membre | |
PT | O-Member | Membre | |
RO | O-Member | Membre | |
RU | P-Member | Membre | |
SG | O-Member | Membre | |
ZA | O-Member | Membre | |
ES | P-Member | Membre | |
SE | O-Member | Membre | |
GB | P-Member | Membre | |
US | P-Member | Membre |
Faits et chiffres
Secrétariat | Allemagne |
---|---|
Pays Participants | 16 |
Pays Observateurs | 19 |
Président | Mr Akira Ono (JP) Term of office : 2022-02 | |
---|---|---|
Secrétaire | Mr Norbert Fabricius (DE) | |
Secrétaire Adjoint | Mr Werner Bergholz (DE) | |
Secrétaire Adjoint | Mr Gerd Weking (DE) |
Contacts Bureau Central IEC
Ingénieur | Ms Marianna Kramarikova | |
---|---|---|
Standards Project Administrator | Ms Nadine Andrey | |
Editeur | Mr Richard Cook |
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Comité |
Description |
Incoming liaison representative |
Outgoing liaison representative |
---|---|---|---|
LIAISON_IEC | |||
TC 1 | Terminologie | Mr Norbert Fabricius |
|
TC 21 | Accumulateurs | ||
SC 21A | Accumulateurs alcalins et autres accumulateurs à électrolyte non acide | Mr Gerd Weking |
Mr Gerd Weking |
TC 47 | Dispositifs à semiconducteurs | Mr Joonho Bae |
|
TC 55 | Fils de bobinage | Mr Mike Leibowitz |
Mr Mike Leibowitz |
TC 82 | Systèmes de conversion photovoltaïque de l'énergie solaire | Mr Bengt Jäckel |
Mr Bengt Jäckel |
TC 86 | Fibres optiques | Mr Moshe Oron |
|
SC 86B | Dispositifs d'interconnexion et composants passifs à fibres optiques | ||
TC 110 | Affichages électroniques | Mr Mingsheng Qiao |
|
TC 111 | Normalisation environnementale pour les produits et les systèmes électriques et électroniques | ||
TC 119 | Electronique imprimée | Mr Haeseong Lee |
|
LIAISON_ISO | |||
ISO/TC 229 | Nanotechnologies | Mr Denis Koltsov |
|
ISO/TC 229 | Nanotechnologies | Mr David Michael |
Groupes de Travail
|
Description
|
Organisation
|
Incoming liaison representative
|
Outgoing liaison representative
|
---|---|---|---|---|
LIAISON_C | ||||
WG 3 |
Evaluation de la performance
|
IEEE | ||
WG 3 |
Evaluation de la performance
|
SEMI |
Mr Werner Bergholz
|
|
WG 3 |
Evaluation de la performance
|
ANF |
Mr Bin-Cheng Yao
|
|
WG 8 |
Graphene related materials/Carbon nanotube materials
|
GFSC |
Mr Norbert Fabricius
|
