TC 104

IEC 60364-5-54/AMD1 ED3: Amendment 1 - Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

IEC TS 60695-2-21: Fire hazard testing - Part 2-21: Fire containment test on finished units

Result of Voting on 47/2621/CDV - IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

Compilation of Comments on 47/2622/CD - IEC 63275-1 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

Compilation of Comments on 47/2623/CD - IEC 63275-2 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating

Compilation of Comments on 47/2624/CD - IEC 63284 ED1: Semiconductor devices - Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors

IEC 62262/AMD1 ED1: Amendment 1 - Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code)

Review report of IEC 60050-602 ED1: International Electrotechnical Vocabulary (IEV) - Part 602: Generation, transmission and distribution of electricity - Generation

Review report of IEC 60050-603 ED1: International Electrotechnical Vocabulary (IEV) - Part 603: Generation, transmission and distribution of electricity - Power systems planning and management

Review report of IEC 60050-605 ED1: International Electrotechnical Vocabulary (IEV) - Part 605: Generation, transmission and distribution of electricity - Substations

Review reports of 60050-614 ED1: International Electrotechnical Vocabulary (IEV) - Part 614: Generation, transmission and distribution of electricity - Operation

Review report of IEC 60050-617 ED1: International Electrotechnical Vocabulary (IEV) - Part 617: Organization/Market of electricity

IEC 60749-28 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Result of Voting on 1/2446/FDIS - IEC 60050-195 ED2: International Electrotechnical Vocabulary (IEV) - Part 195: Earthing and protection against electric shock

Result of Voting on 64/2415/CDV - IEC 60364-5-54/AMD1 ED3: Amendment 1 - Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

Revised Result of Voting on 89/1487/CDV - IEC 60695-2-10 ED3: Fire hazard testing - Part 2-10: Glowing/hot-wire based test methods - Glow-wire apparatus and common test procedure

IEC 60050-195 ED2: International Electrotechnical Vocabulary (IEV) - Part 195: Earthing and protection against electric shock

Compilation of Comments on 70/146/CD - IEC 62262/AMD1 ED1: Amendment 1 - Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code)

Revised Result of Voting on 89/1492/CDV - IEC 60695-2-11 ED3: Fire hazard testing - Part 2-11: Glowing/hot-wire based test methods - Glow-wire flammability test method for end-products (GWEPT)

Revised Result of Voting on 89/1491/CDV - IEC 60695-2-13 ED3: Fire hazard testing - Part 2-13: Glowing/hot-wire based test methods - Glow-wire ignition temperature (GWIT) test method for materials

Revised Result of Voting on 89/1497/CDV - IEC 60695-2-12 ED3: Fire hazard testing - Part 2-12: Glowing/hot-wire based test methods - Glow-wire flammability index (GWFI) test method for materials

Compilation of Comments on 25/696/CD - IEC 80000-17 ED1: Quantities and units - Part 17: Time dependency

Result of Voting on 47/2633/FDIS - IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Result of Voting on 47/2627/FDIS - IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

Result of Voting on 47/2628/FDIS - IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

Revised review report of IEC 60479-2 ED1: Effects of current on human beings and livestock - Part 2: Special aspects

IEC 60479-2 ED2: Effects of current on human beings and livestock - Part 2: Special aspects

IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Review report on IEC 60027-1 Ed6: Letters symbols to be used in electrical technology - Part 1: General

IEC 80000-17 ED1: Quantities and units - Part 17: Time dependency

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI test for MOSFET

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

Result of Voting on 47/2562/CDV - IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Result of Voting on 89/1498/DTS - IEC TS 60695-11-40 ED2: Fire hazard testing - Part 11-40: Test flames - Confirmatory tests - Guidance

Result of Voting on 89/1462/CDV - IEC 60695-4 ED5: Fire hazard testing - Part 4: Terminology concerning fire tests for electrotechnical products

Result of Voting on 89/1471/CDV - IEC 60695-5-1 ED3: Fire hazard testing - Part 5-1: Corrosion damage effects of fire effluent - General guidance - "PROPOSED HORIZONTAL STANDARD"

Result of Voting on 89/1472/CDV - IEC 60695-6-1 ED3: Fire hazard testing - Part 6-1: Smoke obscuration - General guidance "PROPOSED HORIZONTAL STANDARD"

Result of Voting on 89/1469/CDV - IEC 60695-9-2 ED2: Fire hazard testing - Part 9-2: Surface spread of flame - Summary and relevance of test methods - "PROPOSED HORIZONTAL STANDARD"

Result of Voting on 89/1473/DTS - IEC TS 60695-5-2 ED3: Fire hazard testing - Part 5-2: Corrosion damage effects of fire effluent - Summary and relevance of test methods

Result of Voting on 89/1482/CDV - IEC 60695-11-11 ED1: Fire hazard testing - Part 11-11: Test flames - Determination of the characteristic heat flux for ignition from a non-contacting flame source

Result of Voting on 89/1489/CDV - IEC 60695-7-2 ED2: Fire hazard testing - Part 7-2: Toxicity of fire effluent - Summary and relevance of test methods

Review report of IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level

Result of Voting on 111/573/FDIS - IEC 62321-3-2 ED2: Determination of certain substances in electrotechnical products - Part 3-2: Screening - Fluorine, bromine and chlorine in polymer and electronics by combustion-ion chromatography (C-IC)

IEC 63275-1 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 1: Test method for bias temperature instability

IEC 63275-2 ED1: Semiconductor devices - Reliability test method for silicon carbide discrete metal-oxide semiconductor field effect transistors - Part 2: Test method for bipolar degradation by body diode operating

IEC 63284 ED1: Semiconductor devices - Reliability test method of on-stress reliability by inductive load switching for gallium nitride transistors

Result of Voting on 1/2407/CDV - IEC 60050-195 ED2: International Electrotechnical Vocabulary (IEV) - Part 195: Earthing and protection against electric shock

Result of Voting on 47/2588/CDV - IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

Compilation of Comments on 47/2599/CD - IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

IEC 62321-3-2 ED2: Determination of certain substances in electrotechnical products - Part 3-2: Screening - Fluorine, bromine and chlorine in polymer and electronics by combustion-ion chromatography (C-IC)

IEC 60695-2-12 ED3: Fire hazard testing - Part 2-12: Glowing/hot-wire based test methods - Glow-wire flammability index (GWFI) test method for materials