International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 104

Environmental conditions, classification and methods of test

 
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Other Documents TC 104 since 2018-11-18

Reference, Title
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Date

Closing

Date

CENELEC

Voting /

Comment

64/2407/RVC

Result of Voting on 64/2370/CDV - IEC 60364-5-54/AMD1 ED3: Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

2019-11-15 Y
89/1487/CDV

IEC 60695-2-10 ED3: Fire hazard testing - Part 2-10: Glowing/hot-wire based test methods - Glow-wire apparatus and common test procedure

2019-11-01 2020-01-24 Y
89/1489/CDV

IEC 60695-7-2 ED2: Fire hazard testing - Part 7-2: Toxicity of fire effluent - Summary and relevance of test methods

2019-11-01 2020-01-24 Y
111/554/RVC

Result of Voting on 111/515/CDV - IEC 62321-10 ED1: Determination of certain substances in electrotechnical products - Part 10: Polycyclic aromatic hydrocarbons (PAHs) in polymers and electronics by gas chromatography-mass spectrometry (GC-MS)

2019-10-18 Y
47/2599/CD

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

2019-10-11 2020-01-03 N
89/1482/CDV

IEC 60695-11-11 ED1: Fire hazard testing - Part 11-11: Test flames - Determination of the characteristic heat flux for ignition from a non-contacting flame source

2019-10-11 2020-01-03 Y
47/2588/CDV

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2019-09-27 2019-12-20 N
47/2593/CC

Compilation of Comments on 47/2528/CD - IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

2019-09-20 N
111/553/RVD

Result of Voting on 111/536/FDIS - IEC 62430 ED2: Environmentally conscious design (ECD) - Principles, requirements and guidance

2019-09-20 Y
1/2407/CDV

IEC 60050-195 ED2: International Electrotechnical Vocabulary (IEV) - Part 195: Earthing and protection against electric shock

2019-09-13 2019-11-29 N
89/1488/RVDTS

Result of Voting on 89/1465/DTS - IEC TS 60695-2-20 ED3: Fire hazard testing - Part 2-20: Glowing/hot-wire based test methods - Hot wire ignition test - Apparatus, confirmatory test arrangement and guidance

2019-09-13 N
89/1481/CC

Compilation of Comments on 89/1466/CD - IEC 60695-7-2 ED2: Fire hazard testing - Part 7-2: Toxicity of fire effluent - Summary and relevance of test methods

2019-08-16 Y
89/1475/CC

Compilation of Comments on 89/1470/CD - IEC 60695-11-11 ED1: Fire hazard testing - Part 11-11: Test flames - Determination of the characteristic heat flux for ignition from a non-contacting flame source

2019-07-19 Y
89/1476/CC

Compilation of Comments on 89/1467/CD - IEC TS 60695-11-40 ED2: Fire hazard testing - Part 11-40: Test flames - Confirmatory tests - Guidance

2019-07-19 N
89/1477/RVN

Result of Voting on 89/1464/NP - PNW TS 89-1464 ED1: IEC TS 60695-2-21: Fire hazard testing - Part 2-21: Fire containment test on end products

2019-07-19 N
1/2392A/CC

Compilation of Comments on 1/2358/CD - IEC 60050-195 ED2: International Electrotechnical Vocabulary - Part 195: Earthing and protection against electric shock

2019-07-12 N
111/536/FDIS

IEC 62430 ED2: Environmentally conscious design (ECD) - Principles, requirements and guidance

2019-07-05 2019-08-16 Y Voting Result
47/2570/CDV

IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI Test for MOSFET

2019-06-14 2019-09-06 N Voting Result
47/2562/CDV

IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

2019-05-24 2019-08-16 Y Voting Result
89/1474/CC

Compilation of Comments on 89/1463/CD - IEC 60695-2-10 ED3: Fire hazard testing - Part 2-10: Glowing/hot-wire based test methods - Glow-wire apparatus and common test procedure - PROPOSED HORIZONTAL STANDARD

2019-05-17 Y
64/2370/CDV

IEC 60364-5-54/AMD1 ED3: Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

2019-05-03 2019-07-26 Y Voting Result
47/2567/CC

Compilation of Comments on 47/2527/CD - IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2019-04-19 N
47/2560/RR

Review report of IEC 60749-30 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

2019-04-05 Y
89/1469/CDV

IEC 60695-9-2 ED2: Fire hazard testing - Part 9-2: Surface spread of flame - Summary and relevance of test methods - "PROPOSED HORIZONTAL STANDARD"

2019-04-05 2019-06-28 Y Voting Result
89/1471/CDV

IEC 60695-5-1 ED3: Fire hazard testing - Part 5-1: Corrosion damage effects of fire effluent - General guidance - "PROPOSED HORIZONTAL STANDARD"

2019-04-05 2019-06-28 Y Voting Result
89/1472/CDV

IEC 60695-6-1 ED3: Fire hazard testing - Part 6-1: Smoke obscuration - General guidance "PROPOSED HORIZONTAL STANDARD"

2019-04-05 2019-06-28 Y Voting Result
47/2554/RVD

Result of Voting on 47/2539/FDIS - IEC 60749-18 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

2019-03-22 Y
89/1473/DTS

IEC TS 60695-5-2 ED3: Fire hazard testing - Part 5-2: Corrosion damage effects of fire effluent - Summary and relevance of test methods

2019-03-22 2019-06-14 U Voting Result
111/515/CDV

IEC 62321-10 ED1: Determination of certain substances in electrotechnical products - Part 10: Polycyclic aromatic hydrocarbons (PAHs) in polymers and electronics by gas chromatography-mass spectrometry (GC-MS)

2019-03-22 2019-06-14 Y Voting Result
111/522/RVC

Result of Voting on 111/484/CDV - IEC 62959 ED1: Environmentally Conscious Design (ECD) - Principles, requirements and guidance

2019-03-22 Y
89/1462/CDV

IEC 60695-4 ED5: Fire hazard testing - Part 4: Terminology concerning fire tests for electrotechnical products

2019-03-08 2019-05-31 Y Voting Result
47/2544/CC

Compilation of Comments on 47/2502/CD - IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) - Part 1: Fast BTI Test method

2019-02-15 N
89/1470/CD

IEC 60695-11-11 ED1: Fire hazard testing - Part 11-11: Test flames - Determination of the characteristic heat flux for ignition from a non-contacting flame source

2019-02-15 2019-05-10 Y Report of Comments
89/1467/CD

IEC TS 60695-11-40 ED2: Fire hazard testing - Part 11-40: Test flames - Confirmatory tests - Guidance

2019-02-08 2019-05-03 N Report of Comments
89/1468/CC

Compilation of Comments on 89/1428/CD - IEC 60695-11-11 ED1: Fire hazard testing - Part 11-11: Test flames - Determination of the characteristic heat flux for ignition from a non-contacting flame source

2019-02-08 Y
64/2365/CC

Compilation of Comments on 64/2332/CD - IEC 60364-5-54/AMD1 ED3: Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

2019-02-01 Y
89/1465/DTS

IEC TS 60695-2-20 ED3: Fire hazard testing - Part 2-20: Glowing/hot-wire based test methods - Hot wire ignition test - Apparatus, confirmatory test arrangement and guidance

2019-02-01 2019-04-26 N Voting Result
89/1466/CD

IEC 60695-7-2 ED2: Fire hazard testing - Part 7-2: Toxicity of fire effluent - Summary and relevance of test methods

2019-02-01 2019-04-26 Y Report of Comments
47/2539/FDIS

IEC 60749-18 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

2019-01-25 2019-03-08 Y Voting Result
89/1464/NP

PNW TS 89-1464 ED1: IEC TS 60695-2-21: Fire hazard testing - Part 2-21: Fire containment test on end products

2019-01-25 2019-04-19 N Voting Result
70/144/CD

IEC 62262/AMD1 ED1: Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code)

2019-01-18 2019-04-12 Y Report of Comments
89/1463/CD

IEC 60695-2-10 ED3: Fire hazard testing - Part 2-10: Glowing/hot-wire based test methods - Glow-wire apparatus and common test procedure

2019-01-18 2019-04-12 Y Report of Comments
70/143/RR

Review report on IEC 62262 Ed.1: Degrees of protection provided by enclosures for electrical equipment against external mechanical impacts (IK code)

2019-01-11 Y
89/1450/CC

Compilation of Comments on 89/1429/CD - IEC TS 60695-11-40 ED2: Fire hazard testing - Part 11-40: Test flames - Confirmatory tests - Guidance

2019-01-11 N
89/1451/CC

Compilation of Comments on 89/1430/CD - IEC TS 60695-2-20 ED3: Fire hazard testing - Part 2-20: Glowing/hot-wire based test methods - Hot wire ignition test - Apparatus, confirmatory test arrangement and guidance

2019-01-11 N
89/1452/RR

Review Report on IEC 60695-7-2 ED1 Fire hazard testing - Part 7-2: Toxicity of fire effluent - Summary and relevance of test methods

2019-01-11 Y
89/1453/RR

Review Report on IEC 60695-6-1 ED2 Fire hazard testing - Part 6-1: Smoke obscuration - General guidance

2019-01-11 Y
89/1454/RR

Review Report on IEC 60695-5-1 ED2 Fire hazard testing - Part 5-1: Corrosion damage effects of fire effluent - General guidance

2019-01-11 Y
89/1455/RR

Review Report on IEC TS 60695-5-2 ED2 Fire hazard testing - Part 5-2: Corrosion damage effects of fire effluent - Summary and relevance of test methods

2019-01-11 U
89/1456/CC

Compilation of Comments on 89/1431/CD - IEC 60695-4 ED5: Fire hazard testing - Part 4: Terminology concerning fire tests for electrotechnical products

2019-01-11 Y
89/1457/CC

Compilation of Comments on 89/1432/CD - IEC 60695-9-2 ED2: Fire hazard testing - Part 9-2: Surface spread of flame - Summary and relevance of test methods

2019-01-11 Y
89/1447/CC

Compilation of Comments on 89/1437/CD - IEC 60695-2-12 ED3: Fire hazard testing - Part 2-12: Glowing/hot-wire based test methods - Glow-wire flammability index (GWFI) test method for materials

2019-01-04 Y
89/1448/CC

Compilation of Comments on 89/1438/CD - IEC 60695-2-13 ED3: Fire hazard testing - Part 2-13: Glowing/hot-wire based test methods - Glow-wire ignition temperature (GWIT) test method for materials

2019-01-04 Y
89/1445/CC

Compilation of Comments on 89/1436/CD - IEC 60695-2-10 ED3: Fire hazard testing - Part 2-10: Glowing/hot-wire based test methods - Glow-wire apparatus and common test procedure

2018-12-14 Y
89/1446/CC

Compilation of Comments on 89/1435/CD - IEC 60695-2-11 ED3: Fire hazard testing - Part 2-11: Glowing/hot-wire based test methods - Glow-wire flammability test method for end-products (GWEPT)

2018-12-14 Y
47/2527/CD

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

2018-12-07 2019-03-01 N Report of Comments
47/2528/CD

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

2018-12-07 2019-03-01 N Report of Comments
47/2521A/RVC

Result of Voting on 47/2474/CDV - IEC 63068-1 ED1: Semiconductor devices - Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 1: Classification of defects

2018-11-30 N
47/2522A/RVC

Result of Voting on 47/2475/CDV - IEC 63068-2 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 2: Test method for defects using optical inspection

2018-11-30 N