ISO 80000-1 ED2: Quantities and units - Part 1: General

Result of Voting on 47/2570/CDV - IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI Test for MOSFET

Result of Voting on 64/2370/CDV - IEC 60364-5-54/AMD1 ED3: Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

Compilation of Comments on 86/553/CD - IEC 62496-4-214 ED1: Optical circuit boards - Part 4-214: Interface standards – Terminated waveguide OCB assembly using a single-row thirty-two-channel PMT connector

Result of Voting on 111/515/CDV - IEC 62321-10 ED1: Determination of certain substances in electrotechnical products - Part 10: Polycyclic aromatic hydrocarbons (PAHs) in polymers and electronics by gas chromatography-mass spectrometry (GC-MS)

IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial film on silicon carbide substrate

IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

Compilation of Comments on 47/2528/CD - IEC 63229 ED1: Semiconductor devices – The classification of defects in gallium nitride epitaxial wafers on silicon carbide substrate

Result of Voting on 111/536/FDIS - IEC 62430 ED2: Environmentally conscious design (ECD) - Principles, requirements and guidance

Result of Voting on 119/279/FDIS - IEC 62899-101 ED1: Printed Electronics - Part 101: Terminology - Vocabulary

IEC 60050-195 ED2: International Electrotechnical Vocabulary (IEV) - Part 195: Earthing and protection against electric shock

IEC 62899-101 ED1: Printed Electronics - Part 101: Terminology - Vocabulary

WORKING DRAFT FOR COMMENT: Guidelines for defining halogen content terminology in IEC publications

Compilation of Comments on 86/549/CD - IEC 62496-2-61 ED1: Optical circuit boards - Part 2-61: Test methods - Flexibility for flexible optic-electric circuits

Compilation of Comments on 1/2358/CD - IEC 60050-195 ED2: International Electrotechnical Vocabulary - Part 195: Earthing and protection against electric shock

IEC 62430 ED2: Environmentally conscious design (ECD) - Principles, requirements and guidance

IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) - Part 1: Fast BTI Test for MOSFET

IEC 60749-30 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

IEC 60364-5-54/AMD1 ED3: Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

Result of Voting on 107/351/DTR - IEC TR 63238-1 ED1: Process Management for Avionics – Electronics Design – Part 1: Interface Control Document (ICD)

IEC 62496-4-214 ED1: Optical circuit boards - Part 4-214: Interface standards – Terminated waveguide OCB assembly using a single-row thirty-two-channel PMT connector

Compilation of Comments on 47/2527/CD - IEC 63068-3 ED1: Semiconductor devices – Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices - Part 3: Test method for defects using photoluminescence

Result of Voting on 86/548/NP - PNW 86-548: Optical circuit boards - Part 4-xxx: Terminated waveguide OCB assembly using a single-row thirty-two-channel PMT connector

Review report of IEC 60749-30 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing

Result of Voting on 47/2539/FDIS - IEC 60749-18 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

IEC 62321-10 ED1: Determination of certain substances in electrotechnical products - Part 10: Polycyclic aromatic hydrocarbons (PAHs) in polymers and electronics by gas chromatography-mass spectrometry (GC-MS)

Result of Voting on 111/484/CDV - IEC 62959 ED1: Environmentally Conscious Design (ECD) - Principles, requirements and guidance

Result of Voting on 47/2538/FDIS - IEC 60749-17 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

IEC TR 63238-1 ED1: Process Management for Avionics – Electronics Design – Part 1: Interface Control Document (ICD)

IEC 60664-1 ED3: Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests

Compilation of Comments on 47/2502/CD - IEC 62373-1 ED1: Semiconductor devices – Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) - Part 1: Fast BTI Test method

Compilation of Comments on 64/2332/CD - IEC 60364-5-54/AMD1 ED3: Low-voltage electrical installations - Part 5-54: Selection and erection of electrical equipment - Earthing arrangements and protective conductors

IEC 60749-17 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

IEC 60749-18 ED2: Semiconductor devices - Mechanical and climatic test methods - Part 18: Ionizing radiation (total dose)

Result of Voting on 86/547/FDIS - IEC 62496-4-1 ED1: Optical circuit boards - Part 4-1: Interface standards – Terminated waveguide OCB assembly using single-row twelve-channel PMT connectors

Result of Voting on 119/212/CDV - IEC 62899-101 ED1: Printed Electronics - Part 101: Terminology - Vocabulary

PNW 86-548: Optical circuit boards - Part 4-xxx: Terminated waveguide OCB assembly using a single-row thirty-two-channel PMT connector

IEC 62496-2-61 ED1: Optical circuit boards - Part 2-61: Test methods - Flexibility for flexible optic-electric circuits

Compilation of Comments on 109/166A/CD - IEC 60664-1 ED3: Insulation coordination for equipment within low-voltage supply systems - Part 1: Principles, requirements and tests (Proposed horizontal standard)