SC 47E

Discrete semiconductor devices

 
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SC 47E Work programme (14)

Project

Reference

Document

Reference

Init.

Date

Current

Stage

Next

Stage

Working

Group

Project

Leader

Fcst. Publ.

Date

PNW 47E-743 ED1

Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the photocurrent spectroscopy

47E/743A/NP PNW
  • PNW
  • New work item proposal

2021-03

PRVN
  • PRVN
  • Preparation of RVN

2021-05

WG 9 Sang-Geun Lee 2023-05
IEC 60747-5-4 ED2

Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

47E/738/CDV 2019-10 CCDV
  • CCDV
  • Draft circulated as CDV

2021-02

PRVC
  • PRVC
  • Preparation of RVC

2021-05

WG 9 Junichi Yoshida 2022-02
IEC 60747-5-6 ED2

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

47E/745/FDIS 2019-02 CFDIS
  • CFDIS
  • Draft circulated as FDIS

2021-03

PRVD
  • PRVD
  • Preparation of RVD

2021-04

WG 9 Fumio Ogawa 2021-07
IEC TR 60747-5-12 ED1

Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

47E/741/DTR

2021-01 PRVDTR
  • PRVDTR
  • Preparation of RVDTR

2021-03

2021-05

WG 9 Jong-In Shim 2021-11
IEC 60747-5-13 ED1

Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

47E/746/FDIS 2018-09 CFDIS
  • CFDIS
  • Draft circulated as FDIS

2021-03

PRVD
  • PRVD
  • Preparation of RVD

2021-05

WG 9 Aki HIRAMOTO 2021-07
IEC 60747-5-14 ED1

Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

47E/736/CDV 2020-06 CCDV
  • CCDV
  • Draft circulated as CDV

2021-02

PRVC
  • PRVC
  • Preparation of RVC

2021-05

WG 9 Jong-In Shim 2022-02
IEC 60747-5-15 ED1

Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

47E/737A/CDV 2020-06 CCDV
  • CCDV
  • Draft circulated as CDV

2021-03

PRVC
  • PRVC
  • Preparation of RVC

2021-05

WG 9 Dong-Soo Shin 2022-02
IEC 60747-8/AMD1 ED3

Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

47E/726/CDV 2019-01 APUB
  • APUB
  • Approved for publication

2021-03

2021-05

WG 3 Yoshinori Iwano 2021-09
IEC 60747-16-7 ED1

Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

47E/734/CD 2020-02 PCC
  • PCC
  • Preparation of CC

2021-03

2021-04

WG 2 deng shixiong 2022-03
IEC 60747-16-8 ED1

Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

47E/735/CD 2020-02 PCC
  • PCC
  • Preparation of CC

2021-03

2021-04

WG 2 deng shixiong 2022-03
IEC 60747-16-9 ED1

Semiconductor devices – Part 16-9: Microwave integrated circuits – Phase shifters

47E/725/NP 2021-04 ACD
  • ACD
  • Approved for CD

2021-04

CD
  • CD
  • Draft circulated as CD

2021-07

WG 2 li li 2023-04
IEC 60747-18-4 ED1

Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

47E/718/NP 2021-01 ACD
  • ACD
  • Approved for CD

2021-01

CD
  • CD
  • Draft circulated as CD

2021-05

WG 1 JongMuk LEE 2023-12
IEC 60747-18-5 ED1

Semiconductor devices – Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

47E/719/NP 2021-01 ACD
  • ACD
  • Approved for CD

2021-01

CD
  • CD
  • Draft circulated as CD

2021-05

WG 1 JongMuk LEE 2023-12
IEC TS 60747-19-2 ED1

Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of sensors and power supplies to drive smart sensors for low power operation

47E/693/DTS

2019-06 RPUB
  • RPUB
  • Publication received and registered

2021-03

BPUB
  • BPUB
  • Being published

2021-06

WG 1 Kazuyoshi Furuta 2021-07