SC 47D

Semiconductor devices packaging

 
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SC 47D Work programme (6)

Project

Reference

Document

Reference

Init.

Date

Current

Stage

Next

Stage

Working

Group

Project

Leader

Fcst. Publ.

Date

PWI TR 47D-3 ED1

Future IEC TR 60191-7-5 Ed.1: 3D semiconductor package model for precise thermal analysis (JTAM)

PWI
  • PWI
  • Preliminary work item

2020-07

2020-07

Yutaka Kumano
PWI TR 47D-5 ED1

Future IEC TR 60191-7-2 Ed.1: Thermal conductivity measurement method and samples for electronic components

PWI
  • PWI
  • Preliminary work item

2020-07

2020-11

Yutaka Kumano
PWI TR 47D-6 ED1

Future IEC TR 60191-7-4 Ed.1: Printed circuit board specifications to evaluate thermal characteristics of fine pitch semiconductor packages

PWI
  • PWI
  • Preliminary work item

2020-07

2020-11

Yutaka Kumano
PNW 47D-926 ED1

Future 63xxx-2 Ed.1: Thermal standardization on semiconductor packaging – Part 2: 3D thermal simulation models of semiconductor packages for steady-state analysis

47D/926/NP PNW
  • PNW
  • New work item proposal

2020-12

PRVN
  • PRVN
  • Preparation of RVN

2021-03

WG 2 Yutaka Kumano 2023-12
PNW 47D-927 ED1

Future 63xxx-3 Ed.1: Thermal standardization on semiconductor packaging – Part 3: Thermal circuit simulation models of semiconductor packages for transient analysis

47D/927/NP PNW
  • PNW
  • New work item proposal

2021-01

PRVN
  • PRVN
  • Preparation of RVN

2021-04

WG 2 Yutaka Kumano 2023-12
IEC TR 63378-1 ED1

Thermal standardization on semiconductor packages – Part 1: Thermal resistance and thermal parameter of BGA, QFP type semiconductor packages

TDTR
  • TDTR
  • Translation of DTR

2021-02

CDTR
  • CDTR
  • Draft circulated as DTR

2021-04

WG 2 Yutaka Kumano