International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 
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SC 47E Work programme (21)

Project

Reference

Document

Reference

Init.

Date

Current

Stage

Next

Stage

Working

Group

Project

Leader

Fcst. Publ.

Date

PNW 47E-670

Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

47E/670/NP PNW
  • PNW
  • New Work Item Proposal

2019-07

PRVN
  • PRVN
  • Preparation of RVN document

2019-10

WG 2 2022-03
PNW 47E-671

Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

47E/671/NP PNW
  • PNW
  • New Work Item Proposal

2019-07

PRVN
  • PRVN
  • Preparation of RVN document

2019-10

WG 2 2022-03
IEC 60747-5-4 ED2

Semiconductor devices - Discrete devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

47E/683/RR 2019-10 ACD
  • ACD
  • Approved for CD

2019-10

CD
  • CD
  • Draft circulated as CD

2019-11

WG 9 Junichi Yoshida 2021-03
IEC 60747-5-5 ED2

Semiconductor devices - Part 5-5: Optoelectronic devices - Photocouplers

47E/655/CDV 2015-08 PRVC
  • PRVC
  • Preparation of RVC

2019-08

2019-11

WG 4 Patrick Sullivan 2020-07
IEC 60747-5-6 ED2

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

47E/645/CD 2019-02 CDM
  • CDM
  • CD to be discussed at meeting

2019-06

2019-11

WG 9 Fumio Ogawa 2020-12
IEC 60747-5-8 ED1

Semiconductor devices – Part 5-8: Optoelectronic devices – Light emitting diodes – Test method of optoelectronic efficiencies of light emitting diodes

47E/637/CDV 2017-09 RPUB
  • RPUB
  • Publication received and registered

2019-10

BPUB
  • BPUB
  • Publication being printed

2020-01

WG 9 Jong-In Shim 2020-01
IEC 60747-5-9 ED1

Semiconductor devices – Part 5-9: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency based on the temperature-dependent electroluminescence

47E/651/CDV 2017-09 DECPUB
  • DECPUB
  • Publication at Editing Check

2019-10

RPUB
  • RPUB
  • Text for PUB received and registered

2019-10

WG 9 Dong-Soo Shin 2020-01
IEC 60747-5-10 ED1

Semiconductor devices – Part 5-10: Optoelectronic devices – Light emitting diodes – Test method of the internal quantum efficiency by the room-temperature reference point

47E/652/CDV 2017-09 DECPUB
  • DECPUB
  • Publication at Editing Check

2019-10

RPUB
  • RPUB
  • Text for PUB received and registered

2019-10

WG 9 Jong-In Shim 2020-01
IEC 60747-5-11 ED1

Semiconductor devices – Part 5-11: Optoelectronic devices – Light emitting diodes – Test method of radiative and nonradiative currents of light emitting diodes

47E/653/CDV 2018-11 DECPUB
  • DECPUB
  • Publication at Editing Check

2019-10

RPUB
  • RPUB
  • Text for PUB received and registered

2019-10

WG 9 Dong-Soo Shin 2020-01
IEC TR 60747-5-12 ED1

Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

PWI
  • PWI
  • Preliminary Work Item

2018-07

2019-05
IEC 60747-5-13 ED1

Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

47E/661/CD 2018-09 CDM
  • CDM
  • CD to be discussed at meeting

2019-10

2019-11

WG 9 Fumio Ogawa 2020-12
IEC 60747-8/AMD1 ED3

Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

47E/669/CD 2019-01 PCC
  • PCC
  • Preparation of CC

2019-09

2019-10

WG 3 Yoshinori Iwano 2021-12
IEC 60747-9 ED3

Semiconductor devices - Part 9: Discrete devices - Insulated-gate bipolar transistors (IGBTs)

47E/675/FDIS


2016-05 BPUB
  • BPUB
  • Being published

2019-10

PPUB
  • PPUB
  • Publication published

2019-11

WG 3 Shuji Miyashita 2019-11
IEC 60747-14-10 ED1

Semiconductor devices - Part 14-10: Semiconductor sensors - Performance evaluation methods for wearable glucose sensors

47E/679/FDIS


2016-09 PRVD
  • PRVD
  • Preparation of RVD

2019-10

APUB
  • APUB
  • Approved for publication

2019-10

WG 1 Jae Yeong Park 2019-11
IEC 60747-14-11 ED1

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

47E/674/CDV 2017-06 CCDV
  • CCDV
  • Draft circulated as CDV

2019-09

PRVC
  • PRVC
  • Preparation of RVC

2019-12

PT 60747-14-11 Kunnyun Kim 2020-11
IEC 60747-16-5/AMD1 ED1

Amendment 1 - Semiconductor devices - Part 16-5: Microwave integrated circuits - Oscillators

47E/673/CDV 2019-03 CCDV
  • CCDV
  • Draft circulated as CDV

2019-09

PRVC
  • PRVC
  • Preparation of RVC

2019-12

WG 2 Masao Nakayama 2020-10
IEC 60747-17 ED1

Semiconductor devices - Part 17: Magnetic and capacitive coupler for basic and reinforced isolation

47E/654/CDV 2015-01 PRVC
  • PRVC
  • Preparation of RVC

2019-08

2019-11

WG 8 Alexander Jaus 2020-07
IEC 60747-18-2 ED1

Semiconductor devices - Part 18-2: Semiconductor bio sensors - Evaluation process of lens-free CMOS photonic array sensor package module

47E/631/CDV 2016-12 RFDIS
  • RFDIS
  • FDIS received and registered

2019-08

CFDIS
  • CFDIS
  • Draft circulated as FDIS

2019-11

WG 1 JongMuk LEE 2020-01
IEC 60747-18-3 ED1

Semiconductor devices - Part 18-3: Semiconductor bio sensors - Fluid flow characteristics of lens-free CMOS photonic array sensor package modules with fluidic system

47E/682/FDIS 2017-03 CFDIS
  • CFDIS
  • Draft circulated as FDIS

2019-09

PRVD
  • PRVD
  • Preparation of RVD document

2019-11

WG 1 JongMuk LEE 2020-01
IEC 60747-19-1 ED1

Semiconductor devices – Part 19-1: Smart sensors – Control scheme of smart sensors

47E/642/CDV 2018-06 RPUB
  • RPUB
  • Publication received and registered

2019-10

BPUB
  • BPUB
  • Publication being printed

2020-01

WG 1 Kazuyoshi Furuta 2020-01
IEC TS 60747-19-2 ED1

Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of smart sensors and power supplies to drive smart sensors

47E/666/CD 2019-06 PCC
  • PCC
  • Preparation of CC document

2019-09

2019-10

WG 1 Kazuyoshi Furuta 2020-10