International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 
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SC 47F Work programme (3)

Project

Reference

Document

Reference

Init.

Date

Current

Stage

Next

Stage

Working

Group

Project

Leader

Fcst. Publ.

Date

IEC 62047-38 ED1

Semiconductor devices – Micro-electromechanical devices – Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

47F/354/CD 2019-10 ACDV
  • ACDV
  • Approved for CDV

2020-05

TCDV
  • TCDV
  • Translation of CDV

2020-08

WG 2 Jae-Hyun Kim 2022-04
IEC 62047-40 ED1

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

47F/360/CD 2019-10 CD
  • CD
  • Draft circulated as CD

2020-06

PCC
  • PCC
  • Preparation of CC document

2020-08

WG 3 wei zhang 2022-10
IEC 62047-41 ED1

Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS Circulators and Isolators

47F/356/CD 2019-10 ACDV
  • ACDV
  • Approved for CDV

2020-05

TCDV
  • TCDV
  • Translation of CDV

2020-08

WG 3 Wei Wang 2022-06