SC 47E

Semiconductor devices – Part 16-9: Microwave integrated circuits – Phase Shifters

Semiconductor devices - Part 5-4: Optoelectronic devices - Semiconductor lasers

Semiconductor devices - Part 5-6: Optoelectronic devices - Light emitting diodes

Semiconductor devices – Part 5-12: Optoelectronic devices – Light emitting diodes – Test method of LED efficiencies

Semiconductor devices - Part 5-13: Optoelectronic devices - Hydrogen sulphide corrosion test for LED packages

Semiconductor devices – Part 5-14: Optoelectronic devices – Light emitting diodes – Test method of the surface temperature based on the thermoreflectance method

Semiconductor devices – Part 5-15: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage based on the electroreflectance spectroscopy

Amendment 1 - Semiconductor devices - Discrete devices - Part 8: Field-effect transistors

Semiconductor devices - Part 14-11: Semiconductor sensors - Test method of surface acoustic wave-based integrated sensors for measuring ultraviolet, illumination and temperature

Semiconductor devices – Part 16-7: Microwave integrated circuits – Attenuators

Semiconductor devices – Part 16-8: Microwave integrated circuits – Limiters

Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors

Semiconductor devices – Part 18-5: Semiconductor bio sensors – Evaluation method for light responsivity characteristics of lens-free CMOS photonic array sensor package modules by incident angle of light

Semiconductor devices - Part 19-2: Smart sensors - Indication of specifications of smart sensors and power supplies to drive smart sensors