TC 113

IEC TS 62607-7-1: Nanomanufacturing - Key control characteristics - Part 7-1: Nano-enabled photovoltaics measurement of the electrical performance and spectral response of tandem cells

IEC TS 62565-3-3: Nanomanufacturing - Material specifications - Part 3-3: Graphene-based material - Sectional blank detail specification: Monolayer graphene

IEC TS 62565-3-4: Nanomanufacturing - Material specifications - Part 3-4: Graphene-based material - Sectional blank detail specification: Bilayer graphene

IEC TS 62607-6-15: Nanomanufacturing – Key control characteristics – Part 6-15: Sample preparation for the reliability test of sheet resistance and contact resistance for graphene and two-dimensional materials

IEC TS 62607-6-17: Nanomanufacturing - Key control characteristics - Part 6-17: Graphene-based materials - Spatial order parameter: XRD and TE

IEC TS 62607-6-23: Nanomanufacturing - Key control characteristics - Part 6-23: Graphene film - Sheet resistance, Carrier density, Carrier mobility: Hall bar

IEC TS 62607-6-24 Nanomanufacturing - Key control characteristics - Part 6-24: Graphene film - Number of layers: Optical contrast

Nano-enabled electrical energy storage – Hybrid Supercapacitors for ISG application – Electrochemical characterisations of electrodes and modules

IEC TS 62565-4-x ED1, Nanomanufacturing – Material specifications – Part 4-x: Quantum dot materials used in Q-LCFs - Blank detail specification

IEC TS 62876-4-x , Nanomanufacturing – Reliability assessments– Part 4-x: Quantum dot materials used in Q-LCFs

IEC TS 62607-3-x (series), Nanomanufacturing – Key control characteristics – Part 3-x: Quantum dot materials used in Q-LCF subassemblies

IEC TS 62607-9-2 Nanomanufacturing – Key control characteristics – Part 9-2: Traceable spatially resolved nano-scale magnetic field measurements – Magneto-optical indicator film technique

IEC TS 62607-2-6 Nanomanufacturing - Key Control Characteristics – Part 2-6: Carbon nanotube materials - Thermal diffusivity of vertically-aligned carbon nanotubes: Flash method

IEC TS 62607-6-28 Nanomanufacturing - Key control characteristics - Part 6-28: Graphene-based material - Number of layers: Raman spectroscopy

IEC TS 62607-6-27 Nanomanufacturing – Key control characteristics – Part 06-27: Two-dimensional materials – Field-effect mobility: 4- terminal measurement

IEC TS 62565-3-6 Nanomanufacturing – Material specification - Part 3-6 Graphene-based material - Blank detail specification: Graphene oxide

IEC TS 62607-8-4 Nanomanufacturing - Key Control Characteristics - Part 8-4: Nano-enabled metal-oxide interfacial devices - Test method for electronic trap states by low-frequency-noise spectroscopy

IEC TS 62876-3-3 Nanomanufacturing – Reliability assessment – Part 3-3: 2D materials – Stability test: Density of interface defects

IEC TS 62565-4-3 Nanomanufacturing – Material specifications – Part 4-3: Luminescent nanomaterials – Blank Detail Specification: Quantum dot materials used in QLED

IEC TS 62607-3-4 Nanomanufacturing – Key control characteristics – Part 3-4: Luminescent nanomaterials – Key control characteristics used in QLED products

Nanomanufacturing – Key Control Characteristics – Part 6-12: Graphene-based material – Number of layers: Raman spectroscopy, optical reflection

IEC TS 62565-3-5: Nanomanufacturing - Material specifications - Part 3-5: Graphene-based material - Sectional blank detail specification: Graphene powder and dispersion

Nanomanufacturing - Key control characteristics - Part 6-29: Graphene-based materials - Defectiveness: Raman spectroscopy

IEC TS 62607-6-18: Nanomanufacturing - Key control characteristics - Part 6-18: Graphene-based material - Functional groups: TGA-FTIR

IEC TS 62607-6-22: Nanomanufacturing - Key control characteristics - Part 6-22: Graphene-based materials - Ash content: Incineration

Nanomanufacturing - Material specifications – Part 5-3: Nanosized silicon anode material - Blank detail specification

Nanomanufacturing - Material specifications, Part 1 - Basic concept

Nanomanufacturing - Material specifications - Part 2-1: Carbon nanotube materials - Blank detail specification: Single-wall carbon nanotubes

Nanomanufacturing - Material specifications - Part 3-1: Graphene - Blank detail specification

IEC/TS 62565-3-2: Nanomanufacturing - Material specifications - Part 3-2: Graphene - Sectional blank detail specification for nano-ink

Nanomanufacturing - Material specification – Part 5-1: Nanoporous activated carbon for electrochemical capacitor - Blank detail specification

Nanomanufacturing - Material specification – Part 5-2: Nano-enabled electrode of electrochemical capacitor - Blank detail specification

IEC TS 62607-2-1 ED2: Nanomanufacturing - Key control characteristics - Part 2-1: Carbon nanotube materials - Film resistance: Four terminal method

IEC TS 62607-2-2: Nanomanufacturing - Key control Characteristics - Part 2-2: Carbon Nanotube Materials - EM Shielding Effectiveness with Near Field Probe for CNTs

Nanomanufacturing – Key control characteristics – Part 2-5: Carbon nanotube materials – Density of vertically-aligned carbon nanotubes: X-ray absorption method

Nanomanufacturing - Key control characteristics - Part 5-2: Thin-film organic/nano electronic devices - Measuring Alternating Current characteristics

Nanomanufacturing – Key control characteristics - Part 5-4: Energy band gap measurement of nanomaterials by electron energy loss spectroscopy (EELS

Nanomanufacturing – Key control characteristics – Part 6-2: Graphene – Evaluation of the number of layers of graphene

Nanomanufacturing - Key control characteristics - Part 6-4: Graphene-based materials - Sheet resistance: Microwave resonant cavity

Nanomanufacturing - Key control characteristics - Part 6-5: Graphene materials - Contact and sheet resistance: Transfer length method

Nanomanufacturing - Key control characteristics - Part 6-6: Graphene-based materials - Strain uniformity: spatially-resolved Raman spectroscoopy

Nanomanufacturing – Key control characteristics – Part 6-7: Graphene based material – Sheet resistance: van der Pauw method

Nanomanufacturing – Key control characteristics – Part 6-8: Graphene based material – Sheet resistance: In-line four-point probe

Nanomanufacturing - Key control Characteristics - Part 6-9: Graphene-based material – Sheet resistance: Eddy current method

IEC TS 62607-6-10: Nanomanufacturing - Key control characteristics - Part 6-10: Graphene-based material - Sheet resistance: Terahertz time-domain spectroscopy

Nanomanufacturing - Key control characteristics - Part 6-11: Graphene-based Material - Defect density: Raman spectroscopy

Nanomanufacturing – Key control characteristics – Part 6-16: Two-dimensional materials - Doping concentration: Field effect transistor method

Nanomanufacturing - Key control characteristics - Part 6-19: Graphene-based material - Elemental composition: CS analyzer, ONH analyzer

Nanomanufacturing - Key control characteristics - Part 6-20: Graphene-based materials – Metallic impurity content: ICP-MS

IEC TS 62607-6-21: Nanomanufacturing - Key control characteristics - Part 6-21: Graphene-based material – Elemental composition and C/O ratio: XPS

Nanomanufacturing – Keycontrol characteristics – Part 6-25: Two-dimensional materials - Doping concentration: Kelvin Probe Force Microsopy

Nanomanufacturing – key control characteriastics – Part 6-26: 2D materials – Fracture stain and stress, Young’s modulus, residual strain and stress: Bulge test

Nanomanufacturing - Key Control Characteristics - Part 7-2: Nano-enabled photovoltaics - Device evaluation method for indoor light

Nanomanufacturing - Key Control Characteristics - Part 8-3: Nano-enabled metal-oxide interfacial devices – Test method for the analogue change and resistance fluctuation

Nanomanufacturing – Key control characteristics – Part 9-1: Traceable spatially resolved nano-scale stray magnetic field measurements – Magnetic Force Microscopy

Amendment 1 - Nanoscale electrical contacts and interconnects

Nanomanufacturing - Reliability assessment - Part 3.1: Graphene materials - Stability test: Temperature and humidity

Nanotechnologies - A guideline for ellipsometry application to evaluate the thickness of nanoscale films

TS 21356-1: Nanotechnologies -- Structural characterization of graphene -- Part 1: Graphene from powders and dispersions

Nanotechnologies – 3D image reconstruction of rod-supported nano-objects using transmission electron microscopy

Nanotechnologies — Guidance on measurands for characterising nano-objects and materials that contain them

Nanotechnologies - Vocabulary - Part 4: Nanostructured materials

Nanotechnologies - Vocabulary - Part 6: Nano-object characterization