International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 
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SC 47F Work programme (4)

Project

Reference

Document

Reference

Init.

Date

Current

Stage

Next

Stage

Working

Group

Project

Leader

Fcst. Publ.

Date

PNW 47F-366 ED1

Measurement methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

47F/366/NP PNW
  • PNW
  • New Work Item Proposal

2020-09

PRVN
  • PRVN
  • Preparation of RVN document

2020-12

WG 2 Isaku KANNO 2023-09
IEC 62047-38 ED1

Semiconductor devices – Micro-electromechanical devices – Part 38: Test method for adhesion strength of metal powder paste in MEMS interconnection

47F/363/CDV 2019-10 CCDV
  • CCDV
  • Draft circulated as CDV

2020-09

PRVC
  • PRVC
  • Preparation of RVC

2020-12

WG 2 Jae-Hyun Kim 2021-09
IEC 62047-40 ED1

Semiconductor devices - Micro-electromechanical devices - Part 40:Test methods of Micro-electromechanical inertial shock switch threshold

47F/360/CD 2019-10 CDM
  • CDM
  • CD to be discussed at meeting

2020-09

2020-12

WG 3 wei zhang 2022-10
IEC 62047-41 ED1

Semiconductor devices - Micro-electromechanical devices – Part 41: RF MEMS Circulators and Isolators

47F/364/CDV 2019-10 CCDV
  • CCDV
  • Draft circulated as CDV

2020-10

PRVC
  • PRVC
  • Preparation of RVC

2020-12

WG 3 Wei Wang 2021-11