TC 49 |
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection |

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Reference, Edition, Date, Title
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IEC 60122-1:2002+AMD1:2017 CSV
Edition 3.1 (2017-12-08)Quartz crystal units of assessed quality - Part 1: Generic specification
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EN-FR, EN |
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IEC 60122-1:2002
Edition 3.0 (2002-08-09)Quartz crystal units of assessed quality - Part 1: Generic specification
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EN-FR |
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IEC 60122-1:2002/AMD1:2017
Edition 3.0 (2017-12-08)Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification
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EN-FR, EN |
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IEC 60122-2:1983
Edition 2.0 (1983-01-01)Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection
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EN-FR, RU |
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IEC 60122-2-1:1991
Edition 1.0 (1991-07-22)Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply
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EN-FR |
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IEC 60122-2-1:1991/AMD1:1993
Edition 1.0 (1993-09-06)Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply
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EN-FR |
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IEC 60122-3:2010
Edition 4.0 (2010-10-11)Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections
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EN-FR |
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IEC 60122-4:2019
Edition 1.0 (2019-01-24)Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors
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EN-FR |
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IEC 60368-1:2000+AMD1:2004 CSV
Edition 4.1 (2013-05-28)Piezoelectric filters of assessed quality - Part 1: Genericspecification
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EN-FR |
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IEC 60368-1:2000
Edition 4.0 (2000-03-10)Piezoelectric filters of assessed quality - Part 1: Generic specification
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EN-FR |
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IEC 60368-1:2000/AMD1:2004
Edition 4.0 (2004-08-17)Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification
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EN-FR, EN |
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IEC 60368-2-1:1988
Edition 2.0 (1988-06-30)Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters
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EN-FR, RU |
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IEC 60368-2-2:1996
Edition 1.0 (1996-07-25)Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters
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EN-FR |
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IEC 60368-3:2010
Edition 4.0 (2010-11-25)Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections
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EN-FR |
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IEC 60368-4:2000
Edition 1.0 (2000-08-10)Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval
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EN-FR |
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IEC 60368-4-1:2000
Edition 1.0 (2000-11-09)Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval
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EN-FR |
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IEC 60444-1:1986
Edition 2.0 (1986-08-15)Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
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EN-FR, RU |
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IEC 60444-1:1986/AMD1:1999
Edition 2.0 (1999-08-13)Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network
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EN-FR |
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IEC 60444-2:1980
Edition 1.0 (1980-01-01)Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units
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EN-FR, RU |
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IEC TR 60444-4:1988
Edition 1.0 (1988-06-30)Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz
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EN-FR, RU |
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IEC 60444-5:1995
Edition 1.0 (1995-04-07)Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
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EN-FR |
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IEC 60444-6:2013
Edition 2.0 (2013-06-19)Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)
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EN-FR |
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IEC 60444-7:2004
Edition 1.0 (2004-04-05)Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units
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EN-FR, EN |
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IEC 60444-8:2016
Edition 2.0 (2016-12-15)Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units
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EN-FR, EN |
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IEC 60444-9:2007
Edition 1.0 (2007-02-20)Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units
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EN-FR, EN |
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IEC 60444-11:2010
Edition 1.0 (2010-10-07)Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency fL and the effective load capacitance CLeff using automatic network analyzer techniques and error correction
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EN-FR |
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IEC 60483:1976
Edition 1.0 (1976-01-01)Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling
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EN-FR, RU |
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IEC 60642:1979
Edition 1.0 (1979-01-01)Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
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EN-FR, RU |
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IEC 60642:1979/AMD1:1992
Edition 1.0 (1992-09-30)Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions
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EN-FR |
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IEC 60642-2:1994
Edition 1.0 (1994-02-08)Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units
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EN-FR |
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IEC 60642-3:1992
Edition 1.0 (1992-03-15)Piezoelectric ceramic resonators - Part 3: Standard outlines
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EN-FR |
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IEC 60679-1:2017
Edition 4.0 (2017-07-26)Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification
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EN-FR, EN |
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IEC 60679-2:1981
Edition 1.0 (1981-01-01)Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators
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EN-FR, RU |
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IEC 60679-3:2012
Edition 3.0 (2012-12-14)Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections
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EN-FR |
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IEC 60679-4:1997
Edition 1.0 (1997-11-28)Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval
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EN-FR |
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IEC 60679-4-1:1998
Edition 1.0 (1998-02-19)Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval
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EN-FR |
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IEC 60679-5:1998
Edition 1.0 (1998-04-15)Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval
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EN-FR |
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IEC 60679-5-1:1998
Edition 1.0 (1998-04-29)Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval
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EN-FR |
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IEC 60689:2008
Edition 2.0 (2008-11-27)Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values
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EN-FR, EN |
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IEC 60758:2016
Edition 5.0 (2016-05-18)Synthetic quartz crystal - Specifications and guidelines for use
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EN-FR, EN |
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IEC 60862-1:2015
Edition 3.0 (2015-08-20)Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification
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EN-FR |
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IEC 60862-2:2012
Edition 3.0 (2012-05-07)Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use
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EN-FR |
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IEC 60862-3:2003
Edition 2.0 (2003-10-08)Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines
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EN-FR, ES |
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IEC 61019-1:2004
Edition 1.0 (2004-11-02)Surface acoustic wave (SAW) resonators - Part 1: Generic specification
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EN-FR, EN |
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IEC 61019-2:2005
Edition 2.0 (2005-05-12)Surface acoustic wave (SAW) resonators - Part 2: Guide to the use
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EN-FR, EN |
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IEC 61019-3:1991
Edition 1.0 (1991-12-24)Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections
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EN-FR |
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IEC 61080:1991
Edition 1.0 (1991-12-31)Guide to the measurement of equivalent electrical parameters of quartz crystal units
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EN-FR |
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IEC 61178-2:1993
Edition 1.0 (1993-03-31)Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval
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EN-FR |
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IEC 61178-2-1:1993
Edition 1.0 (1993-03-31)Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification
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EN-FR |
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IEC 61178-3:1993
Edition 1.0 (1993-03-31)Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval
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EN-FR |
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IEC 61178-3-1:1993
Edition 1.0 (1993-03-31)Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification
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EN-FR |
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IEC 61240:2016
Edition 3.0 (2016-10-24)Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules
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EN-FR, EN |
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IEC 61253-1:1993
Edition 1.0 (1993-12-17)Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
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EN-FR |
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IEC 61253-2:1993
Edition 1.0 (1993-12-17)Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
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EN-FR |
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IEC 61253-2-1:1993
Edition 1.0 (1993-12-17)Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
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EN-FR |
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IEC 61261-1:1994
Edition 1.0 (1994-03-24)Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval
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EN-FR |
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IEC 61261-2:1994
Edition 1.0 (1994-03-11)Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval
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EN-FR |
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IEC 61261-2-1:1994
Edition 1.0 (1994-03-11)Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E
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EN-FR |
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IEC 61337-1:2004
Edition 1.0 (2004-11-02)Filters using waveguide type dielectric resonators - Part 1: Generic specification
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EN-FR, EN, ES |
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IEC 61337-2:2004
Edition 1.0 (2004-07-06)Filters using waveguide type dielectric resonators - Part 2: Guidance for use
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EN-FR, EN |
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IEC 61338-1:2004
Edition 1.0 (2004-11-02)Waveguide type dielectric resonators - Part 1: Generic specification
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EN-FR, EN |
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IEC 61338-1-3:1999
Edition 1.0 (1999-11-30)Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency
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EN-FR |
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IEC 61338-1-4:2005
Edition 1.0 (2005-11-08)Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency
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EN-FR, EN |
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IEC 61338-1-5:2015
Edition 1.0 (2015-06-25)Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
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EN-FR |
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IEC 61338-2:2004
Edition 1.0 (2004-05-27)Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications
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EN-FR, EN |
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IEC 61338-4:2005
Edition 1.0 (2005-03-23)Waveguide type dielectric resonators - Part 4: Sectional specification
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EN-FR, EN |
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IEC 61338-4-1:2005
Edition 1.0 (2005-03-23)Waveguide type dielectric resonators - Part 4-1: Blank detail specification
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EN-FR, EN |
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IEC 61837-1:2012
Edition 2.0 (2012-04-20)Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines
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EN-FR |
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IEC 61837-2:2018+AMD1:2020 CSV
Edition 3.1 (2020-09-24)Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
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EN-FR, EN |
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IEC 61837-2:2018
Edition 3.0 (2018-05-08)Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
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EN-FR, EN |
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IEC 61837-2:2018/AMD1:2020
Edition 3.0 (2020-09-24)Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures
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EN-FR, EN |
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IEC 61837-3:2015
Edition 2.0 (2015-04-15)Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures
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EN-FR |
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IEC 61837-4:2015
Edition 2.0 (2015-03-27)Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines
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EN-FR |
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IEC TS 61994-1:2007
Edition 2.0 (2007-08-30)Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators
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EN |
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IEC TS 61994-2:2011
Edition 2.0 (2011-06-17)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters
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EN-FR |
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IEC TS 61994-3:2021
Edition 3.0 (2021-01-28)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators
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EN |
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IEC TS 61994-4-1:2018
Edition 3.0 (2018-11-16)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
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EN |
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IEC TS 61994-4-1:2018 RLV
Edition 3.0 (2018-11-16)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal
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EN |
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IEC TS 61994-4-2:2011
Edition 2.0 (2011-03-08)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics
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EN-FR |
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IEC TS 61994-4-3:2008
Edition 1.0 (2008-02-22)Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices
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EN |
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IEC TS 61994-4-4:2018 RLV
Edition 3.0 (2018-11-16)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
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EN |
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IEC TS 61994-4-4:2018
Edition 3.0 (2018-11-16)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices
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EN |
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IEC TS 61994-5:2019
Edition 1.0 (2019-06-26)Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors
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EN |
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IEC 62276:2016
Edition 3.0 (2016-10-24)Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods
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EN-FR, EN |
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IEC 62575-1:2015
Edition 1.0 (2015-10-29)Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification
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EN-FR |
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IEC 62575-2:2012
Edition 1.0 (2012-07-25)Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use
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EN-FR |
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IEC 62604-1:2015
Edition 1.0 (2015-07-16)Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification
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EN-FR |
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IEC 62604-2:2017
Edition 2.0 (2017-11-29)Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use
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EN-FR, EN |
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IEC 62761:2014
Edition 1.0 (2014-02-19)Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)
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EN-FR |
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IEC 62884-1:2017
Edition 1.0 (2017-06-08)Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement
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EN-FR, EN |
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IEC 62884-2:2017
Edition 1.0 (2017-08-30)Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method
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EN-FR, EN |
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IEC 62884-3:2018
Edition 1.0 (2018-03-22)Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods
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EN-FR, EN |
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IEC 62884-4:2019
Edition 1.0 (2019-05-06)Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods
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EN-FR |
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IEC 63041-1:2017
Edition 1.0 (2017-12-13)Piezoelectric sensors - Part 1: Generic specifications
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EN-FR, EN |
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IEC 63041-2:2017
Edition 1.0 (2017-12-13)Piezoelectric sensors - Part 2: Chemical and biochemical sensors
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EN-FR, EN |
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IEC 63041-3:2020
Edition 1.0 (2020-08-12)Piezoelectric sensors - Part 3: Physical sensors
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EN-FR |
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IEC 63155:2020
Edition 1.0 (2020-04-24)Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications
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EN-FR |
