TC 49

Surface acoustic wave (SAW) filters - Part 3: Standard outlines

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

Project of SAW materials standardization

Guide to the use of waveguide type dielectric resonators

Standard for the Test-fixture of Surface Mounting Quartz Crystal Units

Standard to the Test-fixture with load-capacitance of Surface Mounting Quartz Crystal Units

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials for dielectric devices

SAW duplexers - Part 2: Guide to the use

Waveguide type dielectric resonators, General information and test conditions - Measurement method of conductivity at interface between conductor and dielectric material at microwave frequency

Surface acoustic wave oscillators of assessed quality - Part 1: Generic specification

Waveguide type dielectric resonators, Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Guide to measurement method of nonilinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

Surface Acoustic Wave (SAW) Controlled Oscillators Using SAW Resonators and SAW Delay Lines - Part 1: Generic specification

Chemical sensor devices using piezoelectric acoustic wave and vibrations

Quartz crystal units of assessed quality - Part 1: Generic specification

Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification

Amendment 1 - Quartz crystal units of assessed quality - Part 1: Generic specification

Quartz crystal units for frequency control and selection - Part 1: Standard values and test conditions

Amendment 1 - Quartz crystal units for frequency control and selection - Part 1: Standard values and test conditions

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection

Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

Amendment 1 - Quartz crystal units for frequency control and selection - Part 2: Guide to the use of quartz crystal units for frequency control and selection - Section One: Quartz crystal units for microprocessor clock supply

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

Quartz crystal units of assessed quality - Part 3: Standard outlines and lead connections

Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

Amendment 2 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

Amendment 3 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

Amendment 4 - Quartz crystal units for frequency control and selection. Part 3: Standard outlines and pin connections

Quartz crystal units of assessed quality - Part 4: Crystal units with thermistors

Standard definitions and methods of measurement for piezoelectric vibrators operating over the frequency range up to 30 MHz

Piezoelectric filters of assessed quality - Part 1: Generic specification

Amendment 1 - Piezoelectric filters of assessed quality - Part 1: Generic specification

Piezoelectric filters - Part 1: General information, standard values and test conditions

Systematic review of IEC 368-2-1 (1988)

Piezoelectric filters - Part 2-1: Guide to the use of piezoelectric filters - Quartz crystal filters

Piezoelectric filters - Part 2: Guide to the use of piezoelectricfilters - Section 2: Piezoelectric ceramic filters

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections

Piezoelectric filters - Part 3: Standard outlines

Piezoelectric filters of assessed quality - Part 4 : Sectional specification - Capability approval

Piezoelectric filters of assessed quality - Part 4-1: Blank detail specification - Capability approval

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

Amendment 1 - Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 1: Basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a pi-network

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance Co

Measurement of quartz crystal unit parameters by zero phase technique in a pi-network. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance RL and the calculation of other derived values of quartz crystal units, up to 30 MHz

Measurement of quartz crystal units parameters - Part 5: Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction

Measurement of surface mounting quartz crystal units

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD)

Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

Measurement of quartz crystal unit parameters - Part 8 : Test fixture for surface mounted quartz crystal units

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

Measurement of quartz crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units

Piezoelectric and dielectric devices for frequency control and selection - Measurement of quartz crystal unit parameters - Method for the determination of equivalent electrical parameters for GHz band

Measurement of quartz crystal units parameters - Part 10: Test fixture for crystal devices in GHz band

Measurement of quartz crystal unit parameters - Part 11: Standard method for the determination of the load resonance frequency f_L and the effective load capacitance C_Leff using automatic network analyzer techniques and error correction

Guide to dynamic measurements of piezoelectric ceramics with high electromechanical coupling

Systematic review of IEC 642 (1979)

Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

Amendment 1 - Piezoelectric ceramic resonators and resonator units for frequency control and selection - Chapter I: Standard values and conditions - Chapter II: Measuring and test conditions

Piezoelectric ceramic resonator units - Part 2: Guide to the use of piezoelectric ceramic resonator units

Piezoelectric ceramic resonators - Part 3: Standard outlines

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1: Generic specification

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Piezoelectric, dielectric and electrostatic oscillators of assessed quality - Part 1 : Generic specification

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Quartz crystal controlled oscillators of assessed quality-Part 1: Generic apecification

Quartz crystal controlled oscillators of assessed quality- Part 1: Generic specification

Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Amendment to IEC 679-1: Quartz crystal controlled oscillators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specifitacion

Amendment 1 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Amendment 2 - Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification

Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods

Amendment 1 - Quartz crystal controlled oscillators. Part 1: General information, test conditions and methods

Systematic review of IEC 672-2 (1981)

Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections

Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections

Amendment 1 - Quartz crystal controlled oscillators. Part 3: Standard outlines and lead connections

Quartz crystal controlled oscillators of assessed quality - Part 4: Sectional Specification - Capability approval

Quartz crystal controlled oscillators of assessed quality - Part 4-1: Blank detail specification - Capability approval

Quartz crystal controlled oscillators of assessed quality - Part 5: Sectional specification - Qualification approval

Quartz crystal controlled oscillators of assessed quality - Part 5-1: Blank detail specification - Qualification approval

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guidelines

Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide

First supplement

Measurement and test methods for tuning fork quartz crystal units in the range from 10 kHz to 200 kHz and standard values

Measurements and test methods for 32 kHz quartz crystal units for wrist watches and standard values

Synthetic quartz crystal - Specifications and guidelines for use

Synthetic quartz crystal - Specifications and guidelines for use

Synthetic quartz crystal - Specifications and guidelines for use

Synthetic quartz crystal - Specifications and guide to the use

Synthetic quartz crystal - Specifications and guide to the use

Amendment 1 - Synthetic quartz crystal - Specifications and guide to the use

Amendment 2 - Synthetic quartz crystal - Specifications and guide to the use

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

Surface acoustic wave (SAW) filters of assessed quality - Part 1: Generic specification

Surface acoustic wave (SAW) filters. Part 1: General information, standard values and test conditions - Chapter I: General information and standard values - Chapter II: Test conditions

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidelines for the use

Surface acoustic wave (SAW) filters of assessed quality - Part 2: Guidance on use

Surface acoustic wave (SAW) filters - Part 2: Guide to the use of surface acoustic wave filters (Chapter III)

IEC 60862-3 Ed.3: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines

Surface acoustic wave (SAW) filters of assessed quality - Part 3: Standard outlines

Surface acoustic wave (SAW) filters. Part 3: Standard outlines (Chapter IV)

Surface acoustic wave (SAW) resonators - Part 1: Generic specification

Systematic review of IEC 1019-1-1 (1990)

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

Surface acoustic wave (SAW) resonators - Part 1: General information, standard values and test conditions - Section 2: Test conditions

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

Surface acoustic wave (SAW) resonators - Part 2: Guide to the use

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

IEC 61019-3 Ed.2: Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

Surface acoustic wave (SAW) resonators - Part 3: Standard outlines and lead connections

Guide to the measurement of equivalent electrical parameters of quartz crystal units

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 2: Sectional specification - Capability approval - Section 1: Blank detail specification

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval

Quartz crystal units - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 3: Sectional specification - Qualification approval - Section 1: Blank detail specification

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules

Piezoelectric devices - Preparation of outline drawings of quartz crystal units, crystal filters, crystal oscillators, and surface acoustic wave (SAW) for frequency control and selection - General rules

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

Piezoelectric ceramic resonators - A Specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

Piezoelectric ceramic resonators - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 1: Generic specification - Qualification approval

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval

Piezoelectric ceramic filters for use in electronic equipment - A specification in the IEC quality assessment system for electronic components (IECQ) - Part 2: Sectional specification - Qualification approval - Section 1: Blank detail specification - Assessment level E

Filters using waveguide type dielectric resonators - Part 1: Generic specification

Filters using waveguide type dielectric resonators - Part 1: General information, standard values and test conditions - Section 1: General information and standard values

Filters using waveguide type dielectric resonators - Part 1-2: Test conditions

Filters using waveguide type dielectric resonators - Part 2: Guidance for use

Waveguide type dielectric resonators - Part 1: Generic specification

Waveguide type dielectric resonators - Part 1: General information and test conditions - Section 1: General information

Waveguide type dielectric resonators - Part 1-2: General information and test conditions - Test conditions

Waveguide type dielectric resonators - Part 1-3: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at microwave frequency

Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency

Waveguide type dielectric resonators - Part 2: Guide to the use of waveguide type dielectric resonators

Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications

Waveguide type dielectric resonators - Part 4: Sectional specification

Waveguide type dielectric resonators - Part 4-1: Blank detail specification

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Maintenance cycle report on IEC 61837-1 Ed.1:Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 1: Plastic moulded enclosure outlines

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Amendment 1 - Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 2: Ceramic enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 3: Metal enclosures

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

Surface mounted piezoelectric devices for frequency control and selection - Standard outlines and terminal lead connections - Part 4: Hybrid enclosure outlines

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 2: Piezoelectric and dielectric filters

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 2: Piezoelectric and dielectric filters

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric, dielectric and electrostatic oscillators

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3: Piezoelectric and dielectric oscillators

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 3: Piezoelectric and dielectric oscillators

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-1: Piezoelectric materials - Synthetic quartz crystal

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-2: Piezoelectric and dielectric materials - Piezoelectric ceramics

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-3: Materials - Materials for dielectric devices

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 4-4: Piezoelectric materials - Single crystal wafers for surface acoustic wave (SAW) devices

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for surface acoustic wave (SAW) devices

Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 4-4: Materials - Materials for Surface Acoustic Wave (SAW) devices

Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 5: Piezoelectric sensors

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods

Single crystal wafers applied for surface acoustic wave device - Specification and measuring method

Test-fixture of surface mounting quartz crystal units

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 1: Generic specification

Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality - Part 2: Guidelines for the use

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guidelines for the use

Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 2: Guideline for the use

Electrostatic Micro Electro Mechanical Systems (MEMS) oscillators of assembled quality - Part 1 : Generic specification

Guidelines for the measurement method of nonlinearity for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF)

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 2: Phase jitter measurement method

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 3: Frequency aging test methods

Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 4 : Short-term frequency stability test methods

Piezoelectric sensors - Part 1: Generic specifications

Piezoelectric sensors - Part 1: Generic specifications

Piezoelectric sensors - Part 1: Generic specifications

Piezoelectric sensors - Part 2: Chemical and biochemical sensors

Piezoelectric sensors - Part 2: Chemical and biochemical sensors

Piezoelectric sensors - Part 3: Physical sensors

Guidelines for the measurement method of power durability for surface acoustic wave (SAW) and bulk acoustic wave (BAW) devices in radio frequency (RF) applications

Piezoelectric filters. Second supplement