SC 47A

Integrated circuits

 
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SC 47A Project files (170)

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PWI 47A-1 ED1

IEC 62433-3 Ed.1: Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

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  • DEL
  • Deleted/abandoned
EN U
PWI 47A-2 ED1

IEC 62433-4 Ed.1: ICIM-CI, Integrated Circuit Immunity Model, Conducted Immunity

DEL
  • DEL
  • Deleted/abandoned
EN U
PWI 47A-3 ED1

IEC 62228-2 Ed.1: Integrated circuits - EMC Evaluation of LIN transceivers

DEL
  • DEL
  • Deleted/abandoned
EN U
PWI TR 47A-6

Integrated circuits – Three Dimensional Integrated Circuits – Part x: Standardization Roadmap for Fan-Out Packages

DEL
  • DEL
  • Deleted/abandoned
EN U
PWI 47A-9

Semiconductor devices – Fault test method for automotive vehicles – Part 2 Electromagnetic Susceptibility from automotive RADAR

PWI
  • PWI
  • Preliminary work item
EN U
PWI TR 47A-10 ED1

Future IEC TR 62433-X : EMC IC modelling – Part X: Use of ICIM-CI model in an application board modelling

PWI
  • PWI
  • Preliminary work item
EN U
PNW 47A-474 ED1

Semiconductor devices - Integrated circuits - Part 1: General

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  • DEL
  • Deleted/abandoned
EN U 47A/474/NP
PNW 47A-537 ED1

Integrated film circuits - Materials - Part 1: Substrates

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  • DEL
  • Deleted/abandoned
EN U 47A/537/NP PDF file 50 kB
PNW 47A-538 ED1

Integrated film circuits - Materials - Part 2: Methods for the assessment of conductive pastes

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  • Deleted/abandoned
EN U 47A/538/NP PDF file 169 kB
PNW 47A-539 ED1

Integrated film circuits - Materials - Part 3: Methods for the assessment of dielectric pastes

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  • Deleted/abandoned
EN U 47A/539/NP PDF file 56 kB
PNW 47A-540 ED1

Integrated film circuits - Materials - Part 4: Methods for judgement of thick film resistor compositions

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  • Deleted/abandoned
EN U 47A/540/NP PDF file 58 kB
PNW 47A-786 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

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  • DEL
  • Deleted/abandoned
EN U 47A/786/NP PDF file 240 kB
PNW 47A-787 ED1

Semiconductor devices - Integrated circuits - Part 2-xx: Digital integrated circuits - Unified wide power supply voltage range CMOS DC interface standard for non-terminated digital integrated circuits

DEL
  • DEL
  • Deleted/abandoned
EN U 47A/787/NP PDF file 228 kB
PNW TS 47A-789 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 6: Local Injection Horn Antenna (LIHA) method

CAN
  • CAN
  • Draft Cancelled
EN U 47A/789/NP PDF file 1484 kB
PNW 47A-935 ED1

Integrated circuits - Fine alignment of stacked dies in three dimensional integrated circuits

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  • DEL
  • Deleted/abandoned
EN U 47A/935/NP PDF file 774 kB
PNW 47A-878A ED1

Future IEC 62433-4: EMC IC modelling Part 4: Models of Integrated Circuits for EMI behavioural simulation, Conducted Immunity modelling (ICIM-CI)

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  • DEL
  • Deleted/abandoned
EN U 47A/878A/NP PDF file 1132 kB
IEC 60148 ED3

Systematic review of IEC 148 (1969)

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  • Deleted/abandoned
EN-FR U
IEC 60148:1969 ED2

Letter symbols for semiconductor devices and integrated microcircuits

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  • WPUB
  • Publication withdrawn
EN-FR U
IEC 60748-1:2002 ED2

Semiconductor devices - Integrated circuits - Part 1: General

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EN-FR N Webstore
IEC 60748-1:1984 ED1

Semiconductor devices. Integrated circuits. Part 1: General

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  • Deleted publication
EN-FR U
IEC 60748-1:1984/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 1: General

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  • DELPUB
  • Deleted publication
EN-FR U
IEC 60748-1:1984/AMD2:1993 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 1: General

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  • DELPUB
  • Deleted publication
EN-FR U
IEC 60748-1:1984/AMD3:1995 ED1

Amendment 3 - Semiconductor devices. Integrated circuits. Part 1: General

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  • DELPUB
  • Deleted publication
EN-FR U 47A(SEC.)/314/CD
IEC 60748-1/AMD4/FRAG7 ED1

Amendment to the definition of hybrid integrated circuits, in IEC 748-1

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  • DEL
  • Deleted/abandoned
EN U 47/1408/CC
IEC 60748-2:1997 ED2

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits

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IEC 60748-2:1985 ED1

Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits

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EN-FR U
IEC 60748-2:1985/AMD2:1993 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 2: Digital integrated circuits

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  • Deleted publication
EN-FR U
IEC 60748-2/AMD4/FRAG6 ED1

Classification and definition for Programme Logic Devices (PLDs), to be added to IEC 748-1

MERGED
  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/353/CDV
IEC 60748-2-1 ED2

Systematic review of IEC 748-2-1 (1991)

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  • Deleted/abandoned
EN-FR U
IEC 60748-2-1:1991 ED1

Semiconductor devices - Integrated circuits - Part 2-1: Digital integrated circuits - Blank detail specification for bipolar monolithic digital integrated circuit gates (excluding uncommitted logic arrays)

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IEC 60748-2-2 ED2

Systematic review of IEC 60748-2-2 (1992)

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  • Deleted/abandoned
EN-FR U
IEC 60748-2-2:1992 ED1

Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU

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IEC 60748-2-2:1992/AMD1:1994 ED1

Amendment 1 - Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section two: Family specification for HCMOS digital integrated circuits, series 54/74 HC, 54/74 HCT, 54/74 HCU

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IEC 60748-2-3 ED2

Systematic review of IEC 60748-2-3 (1992)

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EN-FR U
IEC 60748-2-3:1992 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section three: Blank detail specification for HCMOS digital integrated circuits (series 54/74 HC, 54/74 HCT, 54/74 HCU)

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IEC 60748-2-4 ED2

Systematic review of IEC 60748-2-4 (1992)

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  • Deleted/abandoned
EN-FR U
IEC 60748-2-4:1992 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section four: Family specification for complementary MOS digital integrated circuits, series 4000 B and 4000 UB

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IEC 60748-2-5 ED2

Systematic review of IEC 60748-2-5 (1992)

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  • Deleted/abandoned
EN-FR U
IEC 60748-2-5:1992 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section five: Blank detail specification for complementary MOS digital integrated circuits (series 4000 B and 4000 UB)

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IEC 60748-2-6 ED2

Systematic review of IEC 60748-2-6 (1991)

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EN-FR U
IEC 60748-2-6:1991 ED1

Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section Six: Blank detail specification for microprocessor integrated circuits

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IEC 60748-2-7 ED2

Systematic review of IEC 748-2-7 (1992)

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  • Deleted/abandoned
EN-FR U
IEC 60748-2-7:1992 ED1

Semiconductor devices. Integrated circuits - Part 2: Digital integrated circuits - Section seven: Blank detail specification for integrated circuit fusible-link programmable bipolar read-only memories

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IEC 60748-2-8:1993 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section Eight: Blank detail specification for integrated circuit static read/write memories

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  • Publication issued
EN-FR U Webstore
IEC 60748-2-9:1994 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 9: Blank detail specification for MOS ultraviolet light erasable electrically programmable read-only memories

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IEC 60748-2-10:1994 ED1

Semiconductor devices - Integrated circuits - Part 2: Digital integrated circuits - Section 10: Blank detail specification for integrated circuit dynamic read/write memories

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  • Publication issued
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IEC 60748-2-11:1999 ED1

Semiconductor devices - Integrated circuits - Part 2-11: Digital integrated circuits - Blank detail specification for single supply integrated circuit, electrically erasable, and programmable read-only memory

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IEC 60748-2-12:2001 ED1

Semiconductor devices - Integrated circuits - part2-12: Digital integrated circuits - Blank detail specification for programmable logic devices (PLDs)

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  • PPUB
  • Publication issued
EN-FR U Webstore
IEC 60748-2-20:2008 ED2

Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits

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  • PPUB
  • Publication issued
EN-FR 2008-06 N Webstore
IEC 60748-2-20:2000 ED1

Semiconductor devices - Integrated circuits Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits

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  • Deleted publication
EN-FR 2000-10 U 47A/591/FDIS
IEC 60748-3 ED2

Systematic review of IEC 748-3 (1986)

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  • Deleted/abandoned
EN-FR U
IEC 60748-3:1986 ED1

Semiconductor devices - Integrated circuits - Part 3: Analogue integrated circuits

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IEC 60748-3:1986/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

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EN-FR U Webstore
IEC 60748-3:1986/AMD2:1994 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 3: Analogue integrated circuits

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EN-FR U Webstore
IEC 60748-3-1 ED2

Systematic review of IEC 748-3-1 (1991)

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EN-FR U
IEC 60748-3-1:1991 ED1

Semiconductor devices. Integrated circuits - Part 3: Analogue integrated circuits - Section one: Blank detail specification for monolithic integrated operational amplifiers

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IEC 60748-4:1997 ED2

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits

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IEC 60748-4/FRAG1 ED2

Interface integrated circuits - Measuring methods of linear ADC and DAC

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EN-FR U 47A(SEC.)/300/CDV
IEC 60748-4/FRAG3 ED2

Interface integrated circuits - Amendments and additions to the IEC 748-4, Chapter II, Clause 2 for Category II

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  • MERGED
  • Fragment merged
EN-FR U 47A(SEC.)/333/CDV
IEC 60748-4/FRAG4 ED2

Letter symbols for use with ISDN - Oriented modular interface circuits (Revision of IEC 748-4)

MERGED
  • MERGED
  • Fragment merged
EN U 47A(U.K.)/244/NP
IEC 60748-4/FRAG5 ED2

Revision of IEC 748-4 - Interface integrated circuits - Measuring methods of linear ADC and DAC

MERGED
  • MERGED
  • Fragment merged
EN U 47A(U.K.)/245/NP
IEC 60748-4/FRAG6 ED2

Amendment to 47A(Sec.)300 - Measuring methods of maximum operating frequency of ADC

MERGED
  • MERGED
  • Fragment merged
EN U 47A(JP)/211/NP
IEC 60748-4:1987 ED1

Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.

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EN-FR U
IEC 60748-4:1987/AMD1:1991 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.

DELPUB
  • DELPUB
  • Deleted publication
EN-FR U
IEC 60748-4:1987/AMD2:1994 ED1

Amendment 2 - Semiconductor devices. Integrated circuits. Part 4: Interface integrated circuits.

DELPUB
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  • Deleted publication
EN-FR U
IEC 60748-4-1:1993 ED1

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 1: Blank detail specification for linear digital-to-analogue converters (DAC)

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IEC 60748-4-2:1993 ED1

Semiconductor devices - Integrated circuits - Part 4: Interface integrated circuits - Section 2: Blank detail specification for linear analogue-to-digital converters (ADC)

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IEC 60748-4-3:2006 ED1

Semiconductor devices - Integrated circuits - Part 4-3: Interface integrated circuits - Dynamic criteria for analogue-digital converters (ADC)

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  • Publication issued
EN 2006-08 N Webstore
IEC 60748-5:1997 ED1

Semiconductor devices - Integrated circuits - Part 5: Semicustom integrated circuits

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EN-FR Y Webstore
IEC 60748-5/FRAG1 ED1

Classification of integrated circuits - New IEC 748-5

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  • Fragment merged
EN-FR U 47A(SEC.)/352/CDV
IEC 60748-5/FRAG3 ED1

Amendment to IEC 748-5 - Chapter V: Acceptance and reliability

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  • Deleted/abandoned
EN-FR U 47A/403/CDV
IEC 60748-11:1990 ED1

Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

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IEC 60748-11:1990/AMD1:1995 ED1

Amendment 1 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

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IEC 60748-11:1990/AMD2:1999 ED1

Amendment 2 - Semiconductor devices - Integrated circuits - Part 11: Sectional specification for semiconductor integrated circuits excluding hybrid circuits

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EN-FR U Webstore
IEC 60748-11-1 ED2

Systematic review of IEC 60748-11-1 (1992)

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EN-FR U
IEC 60748-11-1:1992 ED1

Semiconductor devices - Integrated circuits - Part 11-1: Internal visual examination for semiconductor integrated circuits excluding hybrid circuits

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IEC 60748-20 ED2

Systematic review of IEC 748-20 (1988)

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EN-FR U
IEC 60748-20:1988 ED1

Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

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IEC 60748-20:1988/AMD1:1995 ED1

Amendment 1 - Semiconductor devices. Integrated circuits. Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits

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IEC 60748-20/AMD1/FRAG2 ED1

Amendment to IEC 748-20

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EN-FR U 47A(SEC.)/350/CDV
IEC 60748-20-1:1994 ED1

Semiconductor devices - Integrated circuits - Part 20: Generic specification for film integrated circuits and hybrid film integrated circuits - Section 1: Requirements for internal visual examination

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IEC 60748-21:1997 ED2

Semiconductor devices - Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedures

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IEC 60748-21:1991 ED1

Semiconductor devices. Integrated circuits - Part 21: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure.

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EN-FR U
IEC 60748-21-1:1997 ED2

Semiconductor devices - Integrated circuits - Part 21-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approva lprocedures

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IEC 60748-21-1:1991 ED1

Semiconductor devices - Integrated circuits - Part 21; Section One: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of qualification approval procedure.

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EN-FR U
IEC 60748-22:1997 ED2

Semiconductor devices - Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

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IEC 60748-22:1992 ED1

Semiconductor devices. Integrated circuits - Part 22: Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures.

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EN-FR U
IEC 60748-22-1:1997 ED2

Semiconductor devices - Integrated circuits - Part 22-1: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures

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IEC 60748-22-1:1991 ED1

Semiconductor devices. Integrated circuits - Part 22 - Section One: Blank detail specification for film integrated circuits and hybrid film integrated circuits on the basis of the capability approval procedures.

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EN-FR U
IEC 60748-23-1:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-1: Hybrid integrated circuits and film structures - Manufacturing line certification - Generic specification

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IEC 60748-23-2:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-2: Hybrid integrated circuits and film structures - Manufacturing line certification - Internal visual inspection and special tests

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IEC 60748-23-3:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-3: Hybrid integrated circuits and film structures - Manufacturing line certification - Manufacturers' self-audit checklist and report

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IEC 60748-23-4:2002 ED1

Semiconductor devices - Integrated circuits - Part 23-4: Hybrid integrated circuits and film structures - Manufacturing line certification - Blank detail specification

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EN N Webstore
IEC 60748-23-5:2003 ED1

Semiconductor devices - Integrated circuits, Part 23-5: Hybrid integrated circuits and film structures - Manufacturing line certification - Procedure for qualification approval

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IEC 61739:1996 ED1

Integrated circuits - Part 1: Procedures for manufacturing line approval and quality management

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EN-FR U Webstore
IEC 61748 ED1

Manufacturing line approval (QML) for MCM

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EN-FR Y 47A/541/CDV PDF file 285 kB
IEC 61928 ED1

Internal inspection after encapsulation

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EN U 47A/407/NP
IEC 61933 ED1

Transient energy - Electrostatic discharge sensitivity testing - Machine model

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EN U 47A/410/NP
IEC 61943:1999 ED1

Integrated circuits - Manufacturing line approval application guideline

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IEC TS 61944:2000 ED1

Integrated circuits - Manufacturing line approval - Demonstration vehicles

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IEC TS 61945:2000 ED1

Interated circuits - Manufacturing line approval - Methodology for technology and failure analysis

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IEC 61962 ED1

Electromagnetic compatibility measurement procedures for integrated circuits

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EN U 47A/429/NP
IEC 61964:1999 ED1

Integrated circuits - Memory devices pin configurations

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IEC 61967/FRAG2 ED1

Integrated circuits, Measurement of electromagnetic emission

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EN U 47A/525/NP
IEC 61967-1:2018 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 1: General conditions and definitions

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EN-FR 2018-12 Y Webstore
IEC 61967-1:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions

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EN-FR Y 47A/632/FDIS

IEC TR 61967-1-1:2015 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

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EN 2015-09 N Webstore
IEC TR 61967-1-1:2010 ED1

Integrated circuits - Measurement of electromagnetic emissions - Part 1-1: General conditions and definitions - Near-field scan data exchange format

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EN-FR 2010-05 N 47A/827A/DTR PDF file 1005 kB
IEC 61967-2:2005 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method

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IEC TS 61967-3:2014 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 3: Measurement of radiated emissions - Surface scan method

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EN-FR 2014-08 N Webstore
IEC 61967-3 ED1

Integrated circuits - Measurement of electromagnetic emission, 150 KHz to 1 GHz - Part 3: Measurement of radiated emissions, surface scan method (10 MHz to 3 GHz)

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EN U 47A/532A/CD
IEC TS 61967-3:2005 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 KHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method

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EN-FR 2005-06 N 47A/697/DTS PDF file 358 kB
IEC 61967-4:2021 ED2

Integrated circuits - Measurement of electromagnetic emissions - Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method

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EN-FR 2021-04 Y Webstore
IEC 61967-4:2002+AMD1:2006 CSV ED1.1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

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EN-FR U
IEC 61967-4:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method

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EN-FR Y 47A/636/FDIS

IEC 61967-4:2002/COR1:2017 ED1

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 Ω/150 Ω direct coupling method

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EN-FR Y
IEC 61967-4:2002/AMD1:2006 ED1

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method

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EN-FR Y 47A/735/FDIS

IEC TR 61967-4-1:2005 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4-1: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method - Application guidance to IEC 61967-4

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EN 2005-02 U Webstore
IEC 61967-5:2003 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method

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IEC 61967-6:2002+AMD1:2008 CSV ED1.1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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IEC 61967-6:2002 ED1

Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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IEC 61967-6:2002/COR1:2010 ED1

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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IEC 61967-6:2002/AMD1:2008 ED1

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method

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IEC 61967-7 ED1

Integrated circuits, Universal testboard for EMC measurement

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EN U 47A/552/NP PDF file 103 kB
IEC 61967-8:2011 ED1

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC stripline method

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  • Publication issued
EN-FR 2011-08 Y Webstore
IEC TS 62049 ED1

Guidance for QML approval achievement according to IEC 61739

CAN
  • CAN
  • Draft Cancelled
EN U 47A/473/NP
IEC 62132-1:2015 ED2

Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions

PPUB
  • PPUB
  • Publication issued
EN-FR 2015-10 Y Webstore
IEC 62132-1:2006 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions

DELPUB
  • DELPUB
  • Deleted publication
EN-FR 2006-01 Y 47A/734/FDIS

IEC 62132-2:2010 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 2: Measurement of radiated immunity - TEM cell and wideband TEM cell method

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-04 Y Webstore
IEC 62132-3:2007 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk current injection (BCI) method

WPUB
  • WPUB
  • Publication withdrawn
EN-FR 2007-10 Y 47A/1111/RR PDF file 79 kB
IEC 62132-4 ED2

Integrated circuits - Measurement of electoromagnatic immuity - Part 4: Direct RF power injection method

DEL
  • DEL
  • Deleted/abandoned
EN 2018-12 Y 47A/981/RR PDF file 85 kB
IEC 62132-4:2006 ED1

Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC 62132-5:2005 ED1

Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method

PPUB
  • PPUB
  • Publication issued
EN-FR Y Webstore
IEC TS 62132-6 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 6: Local Injection Horn Antenna (LIHA) method

CAN
  • CAN
  • Draft Cancelled
EN 2012-12 U 47A/866/CC PDF file 311 kB
IEC 62132-8:2012 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC stripline method

PPUB
  • PPUB
  • Publication issued
EN-FR 2012-07 Y Webstore
IEC TS 62132-9:2014 ED1

Integrated circuits - Measurement of electromagnetic immunity - Part 9: Measurement of radiated immunity - Surface scan method

PPUB
  • PPUB
  • Publication issued
EN-FR 2014-08 N Webstore
IEC 62147 ED1

Unified Quality Management Standard for Approval / Certification

DEL
  • DEL
  • Deleted/abandoned
EN U 47A/644/CC Word file 84 kB
PDF file 101 kB
IEC 62200 ED1

Integrated circuits, I/O Interface Model (IMIC)

CAN
  • CAN
  • Draft Cancelled
EN U 47A/575/NP PDF file 317 kB
IEC TS 62215-2:2007 ED1

Integrated circuits - Measurement of impulse immunity - Part 2: Synchronous transient injection method

PPUB
  • PPUB
  • Publication issued
EN N Webstore
IEC 62215-3:2013 ED1

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method

PPUB
  • PPUB
  • Publication issued
EN-FR 2013-06 Y Webstore
IEC TS 62228:2007 ED1

Integrated circuits - EMC evaluation of CAN transceivers

DELPUB
  • DELPUB
  • Deleted publication
EN 2007-12 N 47A/747/DTS PDF file 646 kB
IEC 62228-1:2018 ED1

Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

PPUB
  • PPUB
  • Publication issued
EN 2018-01 Y Webstore
IEC 62228-1/FRAGF ED1

Integrated circuits - EMC evaluation of transceivers - Part 1: General conditions and definitions

MERGED
  • MERGED
  • Publication merged with EN version
FR Y
IEC 62228-2:2016 ED1

Integrated circuits - EMC evaluation of transceivers - Part 2: LIN transceivers

PPUB
  • PPUB
  • Publication issued
EN-FR 2016-12 Y Webstore
IEC 62228-3:2019 ED1

Integrated circuits - EMC evaluation of transceivers - Part 3: CAN transceivers

PPUB
  • PPUB
  • Publication issued
EN-FR 2019-04 Y Webstore
IEC 62228-5 ED1

Integrated circuits – EMC evaluation of transceivers – Part 5: Ethernet transceivers

BPUB
  • BPUB
  • Being published
EN 2021-05 Y 47A/1115/FDIS
IEC 62228-6 ED1

Integrated circuit – EMC Evaluation of transceivers – Part 6: PSI5 transceivers

CD
  • CD
  • Draft circulated as CD
EN 2023-02 Y 47A/1116/CD
PDF file 1113 kB
IEC 62228-7 ED1

Integrated circuits - EMC evaluation of transceivers – Part 7: CXPI transceivers

CDM
  • CDM
  • CD to be discussed at meeting
EN 2022-04 Y 47A/1118/CC PDF file 183 kB
Word file 42 kB
IEC TS 62404:2007 ED1

Logic digital integrated circuits - Specification for I/O interface model for integrated circuit (IMIC version 1.3)

PPUB
  • PPUB
  • Publication issued
EN 2007-12 Y Webstore
IEC 62433-1:2019 ED1

EMC IC modelling - Part 1: General modelling framework

PPUB
  • PPUB
  • Publication issued
EN 2019-03 Y Webstore
IEC TS 62433-1:2011 ED1

EMC IC modelling - Part 1: General modelling framework

DELPUB
  • DELPUB
  • Deleted publication
EN-FR 2011-05 N 47A/840/DTS PDF file 315 kB
IEC 62433-1/FRAGF ED1

EMC IC modelling - Part 1: General modelling framework

MERGED
  • MERGED
  • Publication merged with EN version
FR Y
IEC 62433-1:2019/COR1:2020 ED1

Corrigendum 1 - EMC IC modelling - Part 1: General modelling framework

PPUB
  • PPUB
  • Publication issued
EN Y Webstore
IEC 62433-2:2017 ED2

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

PPUB
  • PPUB
  • Publication issued
EN-FR 2017-03 Y Webstore
IEC 62433-2:2008 ED1

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)

DELPUB
  • DELPUB
  • Deleted publication
EN-FR 2008-10 Y 47A/794/FDIS
MERGED
  • MERGED
  • Publication merged with EN version
FR 2012-10 U
IEC TR 62433-2-1:2010 ED1

EMC IC modelling - Part 2-1: Theory of black box modelling for conducted emission

PPUB
  • PPUB
  • Publication issued
EN-FR 2010-10 N Webstore
IEC 62433-3:2017 ED1

EMC IC modelling - Part 3: Models of integrated circuits for EMI behavioural simulation - Radiated emissions modelling (ICEM-RE)

PPUB
  • PPUB
  • Publication issued
EN-FR 2017-03 Y Webstore
IEC 62433-4:2016 ED1

EMC IC modelling - Part 4: Models of integrated circuits for RF immunity behavioural simulation - Conducted immunity modelling (ICIM-CI)

PPUB
  • PPUB
  • Publication issued
EN-FR 2016-06 Y Webstore
IEC 62433-4/FRAG1 ED1

ICIM-CI, Integrated Circuit Immunity Model, Conducted Immunity

DEL
  • DEL
  • Deleted/abandoned
EN U
IEC 62433-6:2020 ED1

EMC IC modelling - Part 6: Models of integrated circuits for pulse immunity behavioural simulation - Conducted pulse immunity modelling (ICIM-CPI)

PPUB
  • PPUB
  • Publication issued
EN-FR 2020-09 Y Webstore
IEC 63011-1:2018 ED1

Integrated circuits - Three dimensional integrated circuits - Part 1: Terminology

PPUB
  • PPUB
  • Publication issued
EN-FR 2018-12 Y Webstore
IEC 63011-2:2018 ED1

Integrated circuits - Three dimensional integrated circuits - Part 2: Alignment of stacked dies having fine pitch interconnect

PPUB
  • PPUB
  • Publication issued
EN-FR 2018-12 Y Webstore
IEC 63011-3:2018 ED1

Integrated circuits - Three dimensional integrated circuits - Part 3: Model and measurement conditions of through-silicon via

PPUB
  • PPUB
  • Publication issued
EN-FR 2018-11 Y Webstore
IEC 63011-5 ED1

Integrated circuits - Three dimensional integrated circuits - Part 5: Known-good-die test of partly integrated circuits

ACD
  • ACD
  • Approved for CD
EN 2022-10 N 47A/1081/NP PDF file 279 kB
IEC 63011-6 ED1

Integrated circuits - Three dimensional integrated circuits - Part 6: Thermomechanical reliability test method

ACD
  • ACD
  • Approved for CD
EN 2022-10 N 47A/1082/NP PDF file 842 kB
IEC 60148A ED3

Systematic review of IEC 148A (1974)

DEL
  • DEL
  • Deleted/abandoned
EN-FR U
IEC 60148A:1974 ED2

First supplement - Letter symbols for semiconductor devices and integrated microcircuits

WPUB
  • WPUB
  • Publication withdrawn
EN-FR U
IEC 60148B ED3

Systematic review of IEC 148B (1979)

DEL
  • DEL
  • Deleted/abandoned
EN-FR U
IEC 60148B:1979 ED2

Supplement B - Letter symbols for semiconductor devices and integrated microcircuits

WPUB
  • WPUB
  • Publication withdrawn
EN-FR U