WG 2

Semiconductor Device Test Methods and Guidelines - Mechanical, Climatic and Storage

Activity within TC 47 / WG 2 includes the generation, co-ordination and review of testing methods to assess and quantify the quality and reliability of semiconductor products including the design, manufacturing processes as well as component integration into systems.  

TC 47 / WG 2 is responsible for generating, guiding implementation and maintaining climatic, mechanical and electrical tests that include semiconductor component production quality, early / latent / lifetime reliability, electrical/mechanical robustness rating, random use life events and long-term storage