TC 47

Semiconductor devices

 
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WG 2 Convenor & Members

Convenor
National

Committee
Mr Alan E Lucero
 US
Mr Jim Lynch
 GB
Member
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National

Committee
Mr Ulrich AbeleinDE
Mr Ken BallGB
Ms Stephanie Watts ButlerUS
Mr Tim CallaghanGB
Mr Koichi ENDOJP
Mr Armin GottschalkDE
Mr Gerhard HaubnerDE
Mr Yoichi IgaJP
Mr Takahiro ItoJP
Mr Alun Douglas JonesGB
Mr Namsu KimKR
Mr Chul-Hee KimKR
Mr Kee-Won KwonKR
Mr Weng Hong LaiSG
Mr Nicholas (Nick) E LycoudesUS
Mr Yuichi NagahiroJP
Mr Hidetoshi NakanishiJP
Mr Andreas Alexander NiederhoferDE
Mr Yong-Hee ParkKR
Mr Simon Philip PlattGB
Mr Santo PuglieseIT
Mr Gabriele SalaIT
Mr Masaki TanakaJP
Mr Jin Wah Ronnie TeoSG
Mr Markus ThobenDE
Mr Stephen L TisdaleUS
Mr Konstantin S. TkachukRU
Mr Dr. Vali uddinPK
Mr Nobuyuki WakaiJP
Mr Ming XUESG
Mr Yury A. YamshchikovRU
Mr Byoung Jin YoonKR

Title & Task

WG 2

Semiconductor Device Test Methods and Guidelines - Mechanical, Climatic and Storage

 

Activity within TC 47 / WG 2 includes the generation, co-ordination and review of testing methods to assess and quantify the quality and reliability of semiconductor products including the design, manufacturing processes as well as component integration into systems.  

TC 47 / WG 2 is responsible for generating, guiding implementation and maintaining climatic, mechanical and electrical tests that include semiconductor component production quality, early / latent / lifetime reliability, electrical/mechanical robustness rating, random use life events and long-term storage

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Liaisons

Organizations
Liaison Representative
Liaison C
EIA