TC 47

Semiconductor devices

WG 5 Convenor & Members

Convenor		National Committee
Mr Nobuyuki Wakai		JP

Member	National Committee
Mr Werner Berns	DE
Mr Jaap Bisschop	NL
Ms Stephanie Watts Butler	US
Mr Shujun Cai	CN
Mr Leigang Chen	CN
Ms bo Cui	CN
Mr Zhihong Feng	CN
Mr Peter Friedrichs	DE
Mr Eric GUIOT	FR
Mr Roland Baridon Hill	GB
Mr Tobias Hoechbauer	AT
Mr Horst Karolewski	DE
Mr Chul-Hee Kim	KR
Ms Sang-A Kim	KR
Mr Namsu Kim	KR
Mr Andrey V. Konyukhov	RU
Mr Nicholas (Nick) E Lycoudes	US
Mr Jim Lynch	GB
Mr Andreas Martin	DE
Mr Hideya Matsuyama	JP
Ms yan meicun	CN
Mr Yuichi Nagahiro	JP
Mr Jun-ichi Ohno	JP
Mr Noboru OHTANI	JP
Mr Sungju Park	KR
Mr Francesco Patanè	IT
Mr Nicolò Piluso	IT
Mr Junji SENZAKI	JP
Mr Andrea Severino	IT
Mrs Ziva Shalev	IL
Mr Takashi SHINOHE	JP
Mr Choon Beng SIA	SG
Mr Kurt V. Smith	IL
Mr bai song	CN
Mr TORU SUGIYAMA	JP
Mr Konstantin S. Tkachuk	RU
Mr Dr. Vali uddin	PK
Mr Simon Wainwright	IL
Mr KOJI YAMAGUCHI	JP
Mr MANABU YANAGIHARA	JP
Mr Byoung Jin Yoon	KR

Title & Task

WG 5

Wafer Level Reliability for semiconductor devices

Generates terms, definitions and reviews or establishes specifications and standards relating to wafer-level reliability assessment of semiconductor devices in the points of failure mechanism for wafer process and test methods. To accomplish these functions, the working group maintains liaison with and utilizes information and help from other groups and technical experts.

Liaisons

Organizations	Liaison Representative
Liaison C
EIA