International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

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WG 2 Convenor & Members


Mr Alan E Lucero
Mr Jim Lynch
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Mr Ulrich AbeleinDE
Mr Ken BallGB
Ms Stephanie Watts ButlerUS
Mr Tim CallaghanGB
Mr Koichi ENDOJP
Mr Armin GottschalkDE
Mr Gerhard HaubnerDE
Mr Yoichi IgaJP
Mr Takahiro ItoJP
Mr Alun Douglas JonesGB
Mr Chul-Hee KimKR
Mr Namsu KimKR
Mr Kee-Won KwonKR
Mr Weng Hong LaiSG
Mr Nicholas (Nick) E LycoudesUS
Mr Yuichi NagahiroJP
Mr Hidetoshi NakanishiJP
Mr Andreas Alexander NiederhoferDE
Mr Yong-Hee ParkKR
Mr Simon Philip PlattGB
Mr Santo PuglieseIT
Mr Gabriele SalaIT
Mr Masaki TanakaJP
Mr Jin Wah Ronnie TeoSG
Mr Stephen L TisdaleUS
Mr Konstantin S. TkachukRU
Mr Dr. Vali uddinPK
Mr Nobuyuki WakaiJP
Mr Yury A. YamshchikovRU
Mr Byoung Jin YoonKR

Title & Task

WG 2

Climatic and mechanical tests


Activity within TC 47/WG 2 includes the generation, co-ordination and review of climatic, electrical (of which only ESD (liaison with TC 101), latch up and electrical conditions for life tests will be considered) and mechanical test methods needed to assess the quality and reliability of the design and manufacture of semiconductor products and processes. Close liaison with TC 91, TC 104 and with more generally chartered TC 47 Working Groups, whose task involves the definitions of mechanical and/or electrical specifications, will be maintained.

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Liaison Representative