International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices

 
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PT 60747-14-11 Project Leader & Members

Project Leader
National

Committee
Mr Kunnyun Kim
 KR
Member
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National

Committee
Mr Werner BernsDE
Mr Sung-Hoon ChoaKR
Mr Alexander JausDE
Ms Yeonhwa KwakKR
Mr Jungchul LeeKR
Mr Nicholas (Nick) E LycoudesUS
Mr Myungchul ShinKR
Mr Paul J. Van Der WelNL
Mr wei zhangCN

Title & Task

PT 60747-14-11

Semiconductor devices – Part 14-11: Semiconductor sensors – Test method of surface acoustic wave based integrated sensor for measuring ultra violet, illumination and temperature

 

To develop the standard IEC 60747-14-11