TC 119 |
Printed Electronics |

Convenor | NationalCommittee | |
---|---|---|
Mr Leszek Artur Majewski | GB | |
Mr Christian Punckt | DE |
Member | NationalCommittee |
---|---|
Mr Ari Alastalo | FI |
Ms Nina Biddle | GB |
Mrs Cristina Casellas Coll | ES |
Mr Gyoujin Cho | KR |
Mr Ju Hwan Choi | KR |
Mr Byung-Oh Choi | KR |
Mr Ta-Ya Chu | CA |
Mr Sun-Kee Chun | KR |
Mr Hak Jun Chung | KR |
Mr Tim Claypole | GB |
Mr Jan de Boer | NL |
Mr Wilco de Groot | NL |
Ms Julie Ferrigno | CA |
Mr Qi Guan | CN |
Ms Rakel Herrero | ES |
Mr Kei Hyodo | JP |
Mr Seungmin Hyun | KR |
Mr Edward Jerjian | CA |
Mr Minhun Jung | KR |
Mr Kyung-Tae Kang | KR |
Mr Arnold Kell | CA |
Mr Dongsoo Kim | KR |
Mr Junseok Kim | KR |
Mr HYUN JONG KIM | KR |
Mr Yoshiaki Kondoh | JP |
Mr Takehito Kozasa | JP |
Mr Dongjin Lee | KR |
Mr Hoo-Jeong Lee | KR |
Mr Ho-Nyun Lee | KR |
Mr Fengyu LI | CN |
Mr Chae Min Lim | KR |
Mr Shuichi MAEDA | JP |
Mr Yutaka MAJIMA | JP |
Mrs Seong Yi Moon | KR |
Mr Christopher Newsome | GB |
Mr Kei Noda | JP |
Mr Jinsoo Noh | KR |
Mr Simon Ogier | GB |
Mr Joon-Shik Park | KR |
Mr Jucheol Park | KR |
Mr Steve Park | KR |
Mr Beyong Hwan Ryu | KR |
Mr Haridoss Sarma | CA |
Mr Ilja Schwertfeger | DE |
Mrs CHIZU SEKINE | JP |
Mr John E. Turner | CA |
Mr Andreas Willert | DE |
Mr Xiachang ZHANG | CN |
Title & Task
WG 5
Quality assessment
The work process in this group will generate test methods and procedures for the measurement of specified product parameters, for lifetime assessment and for reliability testing and stressing of printed and/or flexible electronics components and products.
