International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 113

Nanotechnology for electrotechnical products and systems

 
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WG 7 Convenor & Members

Convenor
National

Committee
Mr Hiroyuki Akinaga
 JP
Mr Won-Kyu Park
 KR
Member
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National

Committee
Mr Shinji ARAMAKIJP
Mr Joonho BaeKR
Mr Werner BergholzDE
Mr Clare C. ByeonKR
Ms Jeonghee ChungKR
Mr Shifeng DaiCN
Mr Norbert FabriciusDE
Mr Ge GuangluCN
Mr Jens Andreas HauchDE
Ms Evelyn H. HirtUS
Mr Soonkoo kimKR
Mr Denis KoltsovGB
Ms Soonduck KongKR
Ms Hajin LeeKR
Ms xiaojing liuCN
Ms renxiao liuCN
Mr Greg Peter LopinskiCA
Mr Kyungho parkKR
Mr Alex PriceGB
Mr Haridoss SarmaCA
Mrs Nataly A. ShlamkovaRU
Mr Young Jae songKR
Ms Yiqun WANGCN
Mr Gerd WekingDE
Mr Soonil YeoKR
Mr Won Jong YooKR
Mr Yuji YoshidaJP
Mr Choi Young ChulKR
Ms Donghui ZhangCN

Title & Task

WG 7

Reliability

 

To develop standards for the assessment of reliability in the field of nano electrotechnology. Focus is on failure mechanisms and failure modes related to the use of nanomaterials, nanostructures, material interfaces and nanoscale contacts with consideration to size dependent effects. Standards to be developed include test methods to identify failure mechanisms, determine lifetime, analyse failure effects and estimate durability of nano-enabled products..