International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 91

Electronics assembly technology

 
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WG 15 Convenor & Members

Convenor
National

Committee
Mr Osamu Karatsu
 JP
Mr Narayanan Ramachandran
 US
Member
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National

Committee
Mr Koichi FujishiroJP
Mr Yoshiharu FuruiJP
Mr Chris GorringeGB
Mr Sunhue HuhKR
Mr Masahiro ISHIDAJP
Mr Takashi KambeJP
Mr Ryuichi KatohJP
Mr Hajime KawanoJP
Mr Jin ho LeeKR
Mr Jinho LeeKR
Mr Detlef MüllerDE
Mr Myungchul ShinKR
Mr Takeshi SHODAJP
Mr Douglas J SoberUS
Mr Alec StanculescuUS
Mr Mitsuru TakahashiJP
Mr Hiromi YamashitaJP

Title & Task

WG 15

Design Automation: Testing of Electrotechnical Products

 

To maintain the following series to continuously improve testing productivity and quality as a part of solutions :
- IEC 61445 series: DTIF
- IEC 61671 series: ATML
- IEC 61926 series: ATLAS
- IEC 62243 series: AI-ESTATE
- IEC 62525, 62526, 62527: STIL
- IEC 62528: Testability Embedded Core
- IEC 62529: STD
To newly develop testing protocols and technical reports to realize testing for energy saving, high to low level sophistication and interoperability among heterogeneous testing environments.