WG 15

Design Automation: Testing of Electrotechnical Products

To maintain the following series to continuously improve testing productivity and quality as a part of solutions :
- IEC 61445 series: DTIF
- IEC 61671 series: ATML
- IEC 61926 series: ATLAS
- IEC 62243 series: AI-ESTATE
- IEC 62525, 62526, 62527: STIL
- IEC 62528: Testability Embedded Core
- IEC 62529: STD
To newly develop testing protocols and technical reports to realize testing for energy saving, high to low level sophistication and interoperability among heterogeneous testing environments.