SC 65B |
Measurement and control devices |

Convenor | NationalCommittee | |
---|---|---|
Mr A.L.M. van Adrichem | NL |
Member | NationalCommittee |
---|---|
Mr A.L.M. van Adrichem | NL |
Mr John Ahern | GB |
Mr Christoph Becker | DE |
Ms Jean Ann Berthold | US |
Mr Wesley L Carter | US |
Mr Michael P Fuller | US |
Mr Feiyan GONG | CN |
Mr Tango Hioki | JP |
Mr Graham Johnson | GB |
Mr Detlef Koch | DE |
Mr Rainer Kullmann | DE |
Mr Martin Lopez | GB |
Ms yajuan ma | CN |
Mr Ian Mackay | GB |
Mr Michael Maiwald | DE |
Mr Francisco Palacio | ES |
Mr Peter Pergande | GB |
Mr Peter Karl Seefeld | DE |
Mr Brian Sprowell | GB |
Mr Takayoshi Sumi | JP |
Mr James F. Tatera | US |
Mr Hans van der Poort | NL |
Mr Ian Verhappen | CA |
Mr Jian Wang | CN |
Mr Aosheng Wang | US |
Mr Zhongxin Zhao | CN |
Title & Task
WG 14
Analyzing equipment
