International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems


Comments summarized

Comments received
No comments
No response
P-members 3 5 2
O-members 0 1 4
Non-members 0 4 0
Total 3 10 6

P-members with no response: Pakistan; United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47F/178/CD


Project : IEC 62047-26:2016 ED1

IEC 62047-26 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 26: Description and measurement methods for micro trench and needle structures


Reference Circulation date Closing date Downloads
47F/178/CD 2013-11-22 2014-02-28
Compilation of Comments
CC file    
Report of Comments
47F/199/CC 2014-08-15  
export to xls file

All comments

Belgium O 2014-02-04 N
China P 2014-02-28 Y
Czech Republic O
Finland P 2014-02-27 N
France P 2014-02-24 N
Germany P 2014-02-26 Y
Greece - 2014-02-27 N
Ireland - 2014-01-23 N
Italy P 2014-02-17 N
Japan P 2014-02-25 N
Korea, Republic of P 2014-02-28 Y
Netherlands O
Pakistan P
Poland O
Portugal - 2014-02-28 N
Russian Federation P 2014-01-23 N
Sweden O
United Kingdom - 2014-02-06 N
United States of America P