International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Vote for P-Members

P-Members

Voting
P-Members

In favour
In favour %
Criteria
Result
7 7 100 >=66.7% APPROVED

All Votes

Total

Votes Cast
Total

Against
Against %
Criteria
Result
9 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47F/155/FDIS

 

Project : IEC 62047-18 Ed. 1.0

IEC 62047-18 Ed. 1: Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

 

Reference Circulation date Closing date Downloads
47F/155/FDIS 2013-04-26 2013-06-28


Compilation of Comments
CC file    
Voting Result
47F/162/RVD 2013-07-05  
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Belgium O 2013-06-06 A -
China P 2013-06-28 Y -
Denmark - 2013-05-17 A -
Finland P 2013-06-27 A -
France P 2013-06-27 A -
Germany P 2013-06-25 Y -
Greece - 2013-06-27 A -
Italy P 2013-06-21 A -
Japan P 2013-06-25 Y -
Korea, Republic of P 2013-06-24 Y -
Latvia - 2013-06-27 A -
Netherlands O 2013-06-14 A -
Pakistan P 2013-06-20 Y -
Poland O 2013-06-24 A -
Portugal - 2013-06-28 A -
Qatar - 2013-06-26 Y -
Russian Federation P 2013-06-28 Y -
Spain - 2013-06-27 A -
United Kingdom - 2013-06-06 Y -
United States of America P 2013-06-27 Y -

NOTES:



  1. Vote: Does the National Committee agree to publish the FDIS as an International Standard:
    Y = In favour; N = Against; A = Abstention.

  2. Only votes received before the closing date are counted in determining the decision.
    Late Votes: (0).

  3. Abstentions are not taken into account when totalizing the votes.

  4. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.