International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems


Comments summarized

Comments received
No comments
No response
P-members 2 7 1
O-members 0 1 4
Non-members 0 4 0
Total 2 12 5

P-members with no response: United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47F/146/CD


Project : IEC 62047-17:2015 ED1

IEC 62047-17 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films


Reference Circulation date Closing date Downloads
47F/146/CD 2013-01-11 2013-04-12
Compilation of Comments
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All comments

Belgium O 2013-03-19 N
China P 2013-04-12 N
Czech Republic O
Finland P 2013-04-10 N
France P 2013-04-10 N
Germany P 2013-04-09 Y
Greece - 2013-04-12 N
Italy P 2013-04-08 N
Japan P 2013-04-09 Y
Korea, Republic of P 2013-04-05 N
Netherlands O
Pakistan P 2013-04-08 N
Poland O
Portugal - 2013-04-12 N
Russian Federation P 2013-04-12 N
Spain - 2013-04-11 N
Sweden O
United Kingdom - 2013-03-21 N
United States of America P