International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Comments summarized

Comments received
No comments
No response
P-members 1 7 2
O-members 0 1 4
Non-members 0 4 0
Total 1 12 6

P-members with no response: Japan; United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47F/126/CD

 

Project : IEC 62047-15 Ed. 1.0

IEC 62047-15 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding quality between PDMS and glass

 

Reference Circulation date Closing date Downloads
47F/126/CD 2012-08-03 2012-10-05
Compilation of Comments
CC file    
Report of Comments
47F/135A/CC 2013-02-22  
 
export to xls file

All comments

Country
Status
Received
Comments
Belgium O 2012-09-11 N
China P 2012-09-28 N
Czech Republic O
Finland P 2012-10-05 N
France P 2012-10-04 N
Germany P 2012-10-04 Y
Greece - 2012-10-03 N
Italy P 2012-10-02 N
Japan P
Korea, Republic of P 2012-10-02 N
Netherlands O
Pakistan P 2012-10-05 N
Poland O
Portugal - 2012-10-04 N
Russian Federation P 2012-10-04 N
Singapore -*
Spain - 2012-10-05 N
Sweden O
United Kingdom - 2012-09-11 N
United States of America P