International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
SC 47F |
Micro-electromechanical systems |
Comments summarized
Comments received |
No comments |
No response |
|
|---|---|---|---|
| P-members | 1 | 7 | 2 |
| O-members | 0 | 1 | 4 |
| Non-members | 0 | 4 | 0 |
| Total | 1 | 12 | 6 |
P-members with no response: Japan; United States of America
*Comments rejected because they were not submitted in the IEC Comment form.
Report of Comments
Document 47F/126/CD
Project : IEC 62047-15 Ed. 1.0
IEC 62047-15 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 15: Test method of bonding quality between PDMS and glass
| Reference | Circulation date | Closing date | Downloads |
|---|---|---|---|
| 47F/126/CD | 2012-08-03 | 2012-10-05 | |
| Report of Comments | |||
| 47F/135A/CC | 2013-02-22 | ||
781 kB
All comments
Country |
Status |
Received |
Comments |
|---|---|---|---|
| Belgium | O | 2012-09-11 | N |
| China | P | 2012-09-28 | N |
| Czech Republic | O | ||
| Finland | P | 2012-10-05 | N |
| France | P | 2012-10-04 | N |
| Germany | P | 2012-10-04 | Y |
| Greece | - | 2012-10-03 | N |
| Italy | P | 2012-10-02 | N |
| Japan | P | ||
| Korea, Republic of | P | 2012-10-02 | N |
| Netherlands | O | ||
| Pakistan | P | 2012-10-05 | N |
| Poland | O | ||
| Portugal | - | 2012-10-04 | N |
| Russian Federation | P | 2012-10-04 | N |
| Spain | - | 2012-10-05 | N |
| Sweden | O | ||
| United Kingdom | - | 2012-09-11 | N |
| United States of America | P |