International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems


Comments summarized

Comments received
No comments
No response
P-members 2 6 2
O-members 0 1 4
Non-members 1 2 0
Total 3 9 6

P-members with no response: Finland; United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47F/121/CD


Project : IEC 62047-17:2015 ED1

IEC 62047-17 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 17: Bulge test method for measuring mechanical properties of thin films


Reference Circulation date Closing date Downloads
47F/121/CD 2012-03-02 2012-06-08
Compilation of Comments
CC file    
Report of Comments
47F/132A/CC 2012-12-21  
export to xls file

All comments

Belgium O 2012-05-14 N
China P 2012-06-08 N
Czech Republic O
Finland P
France P 2012-05-14 N
Germany P 2012-06-05 Y
Italy P 2012-06-07 N
Japan P 2012-06-01 Y
Korea, Republic of P 2012-05-07 N
Netherlands O
Pakistan P 2012-06-08 N
Poland O
Portugal - 2012-06-08 N
Russian Federation P 2012-06-08 N
Spain - 2012-06-07 Y
Sweden O
United Kingdom - 2012-05-18 N
United States of America P