International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Vote for P-Members

P-Members
Voting
P-Members
In favour
In favour %
Criteria
Result
8 8 100 >=66.7% APPROVED

All Votes

Total
Votes Cast
Total
Against
Against %
Criteria
Result
11 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47F/120/CDV

 

Project : IEC 62047-18 Ed. 1.0

IEC 62047-18 Ed.1: Semiconductor devices - Micro-electromechanical devices - Part 18: Bend testing methods of thin film materials

 

Reference Circulation date Closing date Downloads
47F/120/CDV 2012-03-02 2012-08-03
Compilation of Comments
CC file    
Voting Result
47F/142/RVC 2012-11-23  
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Belgium O 2012-07-10 A -
China P 2012-08-02 Y -
Denmark - 2012-04-18 A -
Finland P 2012-06-15 A -
France P 2012-07-24 Y -
Germany P 2012-08-01 Y Y
Greece - 2012-07-23 A -
Italy P 2012-07-10 A -
Japan P 2012-07-30 Y -
Korea, Republic of P 2012-07-24 Y -
Pakistan P 2012-08-03 Y -
Poland O 2012-06-15 Y -
Portugal - 2012-08-03 A -
Qatar - 2012-08-02 A -
Romania - 2012-08-03 Y -
Russian Federation P 2012-07-24 Y -
Spain - 2012-07-19 A -
United Kingdom - 2012-07-10 Y -
United States of America P 2012-08-03 Y -

NOTES:



  1. Vote: Does the National Committee agree to the circulation of the draft as a FDIS:
    Y = In favour; N = Against; A = Abstention.

  2. Only votes received before the closing date are counted in determining the decision.
    Late Votes: (0).

  3. Abstentions are not taken into account when totalizing the votes.

  4. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.