International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Vote for P-Members

P-Members
Voting
P-Members
In favour
In favour %
Criteria
Result
8 8 100 >=66.7% APPROVED

All Votes

Total
Votes Cast
Total
Against
Against %
Criteria
Result
10 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47F/108/FDIS

 

Project : IEC 62047-14 Ed. 1.0

IEC 62047-14 Ed.1: Semiconductor devices - Microelectromechanical devices - Part 14: Forming limit measuring method of metallic film materials

 

Reference Circulation date Closing date Downloads
47F/108/FDIS 2011-11-25 2012-01-27


Compilation of Comments
CC file    
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Belgium O 2012-01-09 A -
China P 2012-01-20 Y -
Denmark - 2012-01-13 A -
Finland P 2011-12-08 A -
France P 2012-01-26 Y -
Germany P 2012-01-25 Y -
Greece - 2012-01-27 A -
Italy P 2012-01-25 A -
Japan P 2012-01-26 Y -
Korea, Republic of P 2012-01-03 Y -
Netherlands O 2012-01-26 A -
Pakistan P 2012-01-27 Y -
Poland O 2012-01-25 A -
Portugal - 2012-01-26 A -
Romania - 2012-01-26 Y -
Russian Federation P 2012-01-24 Y -
Spain - 2012-01-26 A -
United Kingdom - 2012-01-11 Y -
United States of America P 2012-01-27 Y -

NOTES:



  1. Vote: Does the National Committee agree to publish the FDIS as an International Standard:
    Y = In favour; N = Against; A = Abstention.

  2. Only votes received before the closing date are counted in determining the decision.
    Late Votes: (0).

  3. Abstentions are not taken into account when totalizing the votes.

  4. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.