International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47E

Discrete semiconductor devices


Comments summarized

Comments received
No comments
No response
P-members 1 10 1
O-members 0 2 5
Non-members 0 3 0
Total 1 15 6

P-members with no response: United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47E/458/CD


Project : IEC 60747-14-8 ED1

IEC 60747-14-8 Ed.1: Semiconductor devices - Part 14-8: Semiconductor sensors - Capacitive degradation sensor of liquid


Reference Circulation date Closing date Downloads
47E/458/CD 2013-06-14 2013-08-16
Compilation of Comments
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All comments

Austria P 2013-08-14 N
Belarus O 2013-08-16 N
Belgium O 2013-07-26 N
China P 2013-08-16 N
Czech Republic O
Denmark O
Finland P 2013-07-10 N
France P 2013-07-10 N
Germany P 2013-08-08 N
Greece - 2013-07-30 N
Ireland - 2013-08-12 N
Italy P 2013-07-19 N
Japan P 2013-08-13 Y
Korea, Republic of P 2013-08-12 N
Netherlands P 2013-08-15 N
Poland O
Portugal - 2013-08-14 N
Russian Federation P 2013-08-05 N
Spain O
Sweden O
United Kingdom P 2013-07-26 N
United States of America P