International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 113

Nanotechnology standardization for electrical and electronic products and systems

 

Vote for P-Members

P-Members

Voting
P-Members

In favour
In favour %
Criteria
Result
12 12 100 >=66.7% APPROVED

All Votes

Total

Votes Cast
Total

Against
Against %
Criteria
Result
12 0 0 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 113/184/FDIS

 

Project : IEC 62860 Ed. 1.0

IEC/IEEE 62860: IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials (IEEE Std 1620)

 

Reference Circulation date Closing date Downloads
113/184/FDIS 2013-03-08 2013-05-10

Compilation of Comments
CC file    
Voting Result
113/194/RVD 2013-05-17  
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Australia P 2013-05-10 A -
Austria O 2013-05-07 A -
Belgium - 2013-04-17 A -
Brazil O 2013-05-10 A -
Bulgaria P 2013-04-30 Y -
Canada P 2013-05-06 Y -
China P 2013-05-09 Y -
Finland P 2013-04-30 Y -
France P 2013-05-07 A -
Germany P 2013-04-30 Y -
Greece - 2013-05-09 A -
Italy P 2013-05-06 A -
Japan P 2013-05-08 Y -
Korea, Republic of P 2013-05-06 Y -
Malaysia P 2013-05-03 Y -
Mexico O 2013-05-09 A -
Norway P 2013-05-10 Y -
Portugal O 2013-05-10 A -
Qatar - 2013-05-08 A -
Romania P 2013-05-10 Y -
Russian Federation P 2013-04-29 Y -
Spain P 2013-05-10 A -
United Kingdom O 2013-05-10 A -
United States of America P 2013-05-09 Y -

NOTES:



  1. Vote: Does the National Committee agree to publish the FDIS as an International Standard:
    Y = In favour; N = Against; A = Abstention.

  2. Only votes received before the closing date are counted in determining the decision.
    Late Votes: (0).

  3. Abstentions are not taken into account when totalizing the votes.

  4. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.