International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Comments summarized

Comments received
No comments
No response
P-members 5 11 0
O-members 0 2 13
Non-members 0 2 0
Total 5 15 13


 Illustration: Voting

Report of Comments

Document 47/2169/CD

 

Project : IEC 60749-43 Ed. 1.0

IEC 60749- 43 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan

 

Reference Circulation date Closing date Downloads
47/2169/CD 2013-05-24 2013-07-26
Compilation of Comments
CC file    
Report of Comments
47/2182/CC 2013-09-06  
 
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All comments

Country
Status
Received
Comments
Austria P 2013-07-24 N
Belarus O 2013-07-26 N
Belgium P 2013-07-02 N
Brazil P 2013-07-26 N
Bulgaria O
China P 2013-07-18 N
Czech Republic O
Denmark O
Finland P 2013-06-27 N
France P 2013-07-10 N
Germany P 2013-07-25 Y
Greece - 2013-07-19 N
Hungary O
India P 2013-07-25 N
Ireland O 2013-07-22 N
Italy P 2013-07-18 N
Japan P 2013-07-25 Y
Korea, Republic of P 2013-07-22 N
Netherlands P 2013-07-23 Y
Norway O
Pakistan P 2013-07-26 N
Poland O
Portugal - 2013-07-26 N
Romania O
Russian Federation P 2013-07-26 N
Serbia O
Singapore -*
Spain O
Sweden O
Thailand O
Turkey O
Ukraine O
United Kingdom P 2013-07-05 Y
United States of America P 2013-07-26 Y