International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Vote for P-Members

P-Members
Voting
P-Members
In favour
In favour %
Criteria
Result
12 7 58.3 >=66.7% REJECTED

All Votes

Total
Votes Cast
Total
Against
Against %
Criteria
Result
15 5 33.3 <=25% REJECTED

 Illustration: Voting

Voting Result

REJECTED

Document 47/2155/CDV

 

Project : IEC 60749-28 Ed. 1.0

IEC 60749-28 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)

 

Reference Circulation date Closing date Downloads
47/2155/CDV 2013-03-08 2013-06-14
Compilation of Comments
CC file    
Voting Result
47/2175/RVC 2013-06-28  
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Austria P 2013-06-12 N Y
Belarus O 2013-06-14 A -
Belgium P 2013-05-21 N Y
Brazil P 2013-06-14 A -
China P 2013-06-14 Y -
Denmark O 2013-03-29 A -
Finland P 2013-06-14 A -
France P 2013-06-13 A -
Germany P 2013-06-12 N Y
Greece - 2013-06-14 A -
India P 2013-06-14 A -
Ireland O 2013-05-23 Y -
Italy P 2013-06-14 Y Y
Japan P 2013-05-23 Y -
Korea, Republic of P 2013-06-10 Y -
Netherlands P 2013-05-01 N Y
Pakistan P 2013-06-14 Y -
Poland O 2013-06-07 A -
Portugal - 2013-06-14 A -
Qatar - 2013-06-12 Y -
Romania O 2013-06-06 Y -
Russian Federation P 2013-06-14 Y -
Spain O 2013-06-06 A -
United Kingdom P 2013-05-23 Y -
United States of America P 2013-06-13 N Y

NOTES:



  1. Vote: Does the National Committee agree to the circulation of the draft as a FDIS:
    Y = In favour; N = Against; A = Abstention.

  2. Only votes received before the closing date are counted in determining the decision.
    Late Votes: (0).

  3. Abstentions are not taken into account when totalizing the votes.

  4. P-members not voting: (0).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.