International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Vote for P-Members

P-Members
Voting
P-Members
In favour
In favour %
Criteria
Result
13 12 92.3 >=66.7% APPROVED

All Votes

Total
Votes Cast
Total
Against
Against %
Criteria
Result
14 1 7.1 <=25% APPROVED

 Illustration: Voting

Voting Result

APPROVED

Document 47/2135/FDIS

 

Project : IEC 60749-27 am1 Ed. 2.0

Amendment 1 - IEC 60749-27 Ed.2: Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)

 

Reference Circulation date Closing date Downloads
47/2135/FDIS 2012-06-15 2012-08-17


Compilation of Comments
CC file    
Voting Result
47/2144/RVD 2012-08-31  
 
export to xls file

Result of Voting

Country
Status
Received
Vote
Comments
Austria P 2012-08-16 A -
Belarus O 2012-08-17 A -
Belgium P 2012-07-31 Y -
Brazil P 2012-08-17 Y -
China P 2012-08-17 Y -
Denmark O 2012-07-02 A -
Finland P 2012-08-17 A -
France P 2012-07-24 A -
Germany P 2012-08-03 Y -
Greece - 2012-07-23 A -
India P 2012-08-16 Y -
Ireland O 2012-07-30 Y -
Italy P 2012-07-25 Y -
Japan P 2012-07-09 Y -
Korea, Republic of P 2012-08-06 Y -
Mexico O 2012-08-16 A -
Netherlands P 2012-08-13 N Y
Pakistan P
Poland O 2012-07-26 A -
Portugal - 2012-08-17 A -
Qatar - 2012-08-15 A -
Romania P 2012-08-16 Y -
Russian Federation P 2012-08-17 Y -
United Kingdom P 2012-07-19 Y -
United States of America P 2012-08-16 Y -

NOTES:



  1. Vote: Does the National Committee agree to publish the FDIS as an International Standard:
    Y = In favour; N = Against; A = Abstention.

  2. Only votes received before the closing date are counted in determining the decision.
    Late Votes: (0).

  3. Abstentions are not taken into account when totalizing the votes.

  4. P-members not voting: Pakistan(1).


*Comments rejected because they were not submitted in the IEC Comment form.
**Vote rejected due to lack of justification statement.