International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices


Comments summarized

Comments received
No comments
No response
P-members 4 11 2
O-members 0 3 12
Non-members 0 2 0
Total 4 16 14

P-members with no response: Finland; United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47/2131/CD


Project : IEC 60749-42:2014 ED1

IEC 60749-42 Ed.1: Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage


Reference Circulation date Closing date Downloads
47/2131/CD 2012-05-04 2012-07-06
Compilation of Comments
CC file    
Report of Comments
47/2150A/CC 2013-01-04  
export to xls file

All comments

Austria P 2012-07-05 N
Belarus O 2012-07-06 N
Belgium P 2012-06-18 Y
Brazil P 2012-07-06 N
Bulgaria O
China P 2012-07-05 N
Czech Republic O
Denmark O
Finland P
France P 2012-06-25 Y
Germany P 2012-07-04 Y
Greece - 2012-07-06 N
Hungary O
India P 2012-07-02 N
Ireland O 2012-06-25 N
Italy P 2012-07-05 N
Japan P 2012-06-22 N
Korea, Republic of P 2012-06-26 N
Mexico O 2012-07-05 N
Netherlands P 2012-07-04 N
Norway O
Pakistan P 2012-07-06 N
Poland O
Portugal - 2012-07-06 N
Romania P 2012-07-05 Y
Russian Federation P 2012-07-02 N
Serbia O
Spain O
Sweden O
Thailand O
Turkey O
Ukraine O
United Kingdom P 2012-06-22 N
United States of America P