International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices


Comments summarized

Comments received
No comments
No response
P-members 3 11 3
O-members 1 3 11
Non-members 0 1 0
Total 4 15 14

P-members with no response: Finland; Netherlands; United States of America

*Comments rejected because they were not submitted in the IEC Comment form.

 Illustration: Voting

Report of Comments

Document 47/2123/CD


Project : IEC 60749-28:2017 ED1

IEC 60749-28: Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM)


Reference Circulation date Closing date Downloads
47/2123/CD 2012-03-02 2012-05-04
Compilation of Comments
CC file    
Report of Comments
47/2149A/CC 2012-12-21  
export to xls file

All comments

Austria P 2012-05-04 N
Belarus O 2012-05-04 N
Belgium P 2012-04-27 Y
Brazil P 2012-05-04 N
Bulgaria O
China P 2012-05-04 N
Czech Republic O
Denmark O
Finland P
France P 2012-05-03 N
Germany P 2012-05-03 Y
Hungary O
India P 2012-05-02 N
Ireland O 2012-04-23 N
Italy P 2012-05-03 N
Japan P 2012-04-26 Y
Korea, Republic of P 2012-04-03 N
Mexico O 2012-05-03 N
Netherlands P
Norway O
Pakistan P 2012-04-30 N
Poland O
Portugal - 2012-05-04 N
Romania P 2012-05-04 N
Russian Federation P 2012-05-02 N
Serbia O
Spain O 2012-05-03 Y
Sweden O
Thailand O
Turkey O
Ukraine O
United Kingdom P 2012-04-12 N
United States of America P