International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 86

Fibre optics

 
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Working Documents

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Closing

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86/484/RQ

Result of Questionnaire on 86/480/Q: Extension of the term of office of the Chair of SC: 86A
2015-06-26
86/482/DA

Draft agenda for the meeting to be held in Gwangju, Korea, from 2015-10-09 (starting time: 08:30) to (approximate finishing time: 18:00)
2015-06-19
86/483/RVC

Result of voting on 86/477/CDV: IEC 62129-1/Ed1: Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
2015-06-19
86/481/AC

MTGS 2015: Next meeting of TC 86 and its subcommittees 86A, 86B and 86C to be held in Gwangju, Republic of Korea from 2015-10-01 to 2015-10-09
2015-05-15
86/480/Q

Extension of the term of office of the Chair of SC 86A: Fibres and cables (Mr. Kuyt)
2015-05-082015-06-19
86/477/CDV

IEC 62129-1/Ed1: Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
2015-02-202015-05-22
86/479/MTG

TC86 Tokyo tabled documents
2015-01-30
86/478/RM

Unconfirmed Minutes of the meeting held in Tokyo, Japan, on November 12, 2014
2015-01-09
86/476/CC

Compilation of comments on 86/468/CD: IEC 62129-1/Ed1: Calibration of wavelength/optical frequency measurement instruments - Part 1: Optical spectrum analyzers
2014-11-21
86/475/CD

IEC 62496-2/Ed1: Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
2014-10-172015-01-23
86/471A/DA

Revised draft agenda for the meeting to be held in Tokyo, Japan, from 2014-11-12 (starting time: 09:00) to 2014-11-12 (approximate finishing time: 18:00)
2014-10-10
86/474/PW

Programme of work of the Committee, as recorded by the IEC Central Office in its database
2014-10-10
86/473/RQ

Result of Questionnaire on 86/469/Q: Extension of the term of office of the Chairman of SC: 86B
2014-08-15
86/470/AC

Chairmanship of TC 86
2014-08-012014-11-07
86/471/DA

Draft agenda for the meeting to be held in Tokyo, Japan, from 2014-11-12 (starting time: 09:00) to 2014-11-12 (approximate finishing time: 18:00)
2014-08-01
86/472/RVN

Result of voting on 86/467/NP: Future IEC 62496-2/Ed1: Optical circuit boards - Basic test and measurement procedures - Part 2: General guidance for definition of measurement conditions for optical characteristics of optical circuit boards
2014-08-01