International Standards and Conformity Assessment for all electrical, electronic and related technologies

SC 47F

Micro-electromechanical systems

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

SC 47F02L. Stühler1CD2016-12 

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47F/173/NP  
2013-09-02 
ANW
47F/184/RVN  
47F/184A/RVN pdf file 129 kB
2014-02-072014-01-31
1CD
47F/216/CD pdf file 226 kB
2015-02-272014-07-31
A2CD
 2015-06-30

Project

IEC 62047-27 Ed. 1.0

Semiconductor devices - Micro-electromechanical devices - Part 27: Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)

 

Remark:

Project plan - CDV: 2015-12, FDIS: 2016-07.