International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 113 |
Nanotechnology standardization for electrical and electronic products and systems |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 113 | CDIS | 2013-06 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| CDIS |
| 2013-03-08 | ||||
| DEC | 2013-06-30 | |||||
| APUB | 2013-06-15 | |||||
327 kBProject
IEC/IEEE 62866 Ed. 1.0
IEC/IEEE 62866: IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Remark:
- IEEE fast track procedure - IEEE Std 1620.1 was submitted by IEEE for adoption under the IEC-IEEE Agreement as a dual logo IEC/IEEE publication
Associated Documents:
SMB/4638/QP
SMB/4638A/RV