International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4706S-H ChoaPNW  

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2199/NP pdf file 389 kB
2014-04-25 
ANW
 2014-09-15

Project

PNW 47-2199 Ed. 1.0

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 1: Bending test method for conductive thin films on flexible substrates

 

Remark:

Project plan - CD: 2015-05, IS: 2017-02. Need for co-ordination within IEC : TC 119.