International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702J. LynchCDM2015-07 

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2115/NP  
2011-12-14 
ANW
47/2139/RVN  
47/2139A/RVN  
2012-07-272012-04-30
1CD
47/2169/CD  
2013-05-242013-05-31
CDM
47/2182/CC  
2013-09-05 
ACDV
 2015-04-30

Project

IEC 60749-43 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan

 

Remark:

SMB/5436/DL - CCDV: 2015-04-30. Functions concerned - Safety, Environment and Quality assurance Project plan - CDV: 2014-05, FDIS: 2015-02 Liaison - JEDEC, JEITA Need for co-ordination: IEC TC91 WG3

 

Associated Documents:

SMB/5436/DL