International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 4702Dr. J. LynchPPUB2014-082017

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2117/NP  
2012-01-03 
ANW
47/2129/RVN  
2012-04-202012-05-31
1CD
47/2131/CD  
2012-04-302012-04-30
CDM
47/2150/CC  
47/2150A/CC  
2012-10-02 
ACDV
47/2150/CC  
47/2150A/CC  
2013-01-042012-11-30
CCDV
47/2159/CDV  
2013-03-132013-03-31
ADIS
47/2181/RVC  
47/2181A/RVC doc file 122 kB
pdf file 67 kB
2013-09-042013-09-15
DEC
2014-04-042014-01-31
RDIS
2014-04-092014-04-30
CDIS
47/2200/FDIS

2014-05-092014-07-15
APUB
47/2204/RVD pdf file 47 kB
2014-07-142014-07-15
BPUB
2014-07-152014-07-31
PPUB
2014-08-122014-08-31

Project

IEC 60749-42 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature and humidity storage

 

Remark:

Function concerned - Environment. Project plan - CDV: 2013-03, FDIS: 2014-01 Liaison - JEDEC/EIA and JEITA Need for co-ordination within IEC - TC 91