International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 05 | N.Wakai | PNW |
History
968 kBProject
PNW 47-2157 Ed. 1.0
Copper stress migration test method
Remark:
Project plan - CD: 2013-08, IS: 2015-08. Liaison - JEITA/EIA and JEITA