International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub
Date

Stability

Date

TC 4702J. LynchACDV2016-05 

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2130/NP pdf file 332 kB
2012-04-20 
ANW
47/2151/RVN pdf file 7 kB
47/2151A/RVN doc file 155 kB
pdf file 183 kB
2012-10-022012-09-15
1CD
47/2193/CD pdf file 341 kB
2014-02-262014-01-31
ACDV
2014-10-312014-06-30
CCDV
 2015-01-31

Project

IEC 60749-44 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

 

Remark:

Function concerned - Environment Project plan - CDV: 2013-07, FDIS: 2015-04 Liaison - JEDEC/EIA and JEITA.