International Standards and Conformity Assessment for all electrical, electronic and related technologies

TC 47

Semiconductor devices

 

Detail

Committee
Working Groups
Project Leader

Current

Status

Frcst Pub

Date

Stability

Date

TC 47WG 2J. LynchPPUB2016-082020

History

Stage
Document
Downloads
Decision Date
Target Date
PNW
47/2130/NP PDF file 332 kB
2012-04-20 
ANW
47/2151/RVN PDF file 7 kB
47/2151A/RVN Word file 155 kB
PDF file 183 kB
2012-10-022012-09-15
1CD
47/2193/CD PDF file 341 kB
2014-02-262014-01-31
ACDV
47/2216/CC Word file 296 kB
PDF file 182 kB
2014-10-312014-06-30
CCDV
47/2226/CDV
PDF file 490 kB
PDF file 546 kB
2015-04-172015-01-31
ADIS
47/2285/RVC Word file 122 kB
PDF file 146 kB
2016-02-122015-12-31
DEC
2016-03-222016-04-30
RDIS
2016-04-202016-04-15
CDIS
47/2303/FDIS

2016-05-202016-06-30
APUB
47/2312/RVD PDF file 114 kB
2016-07-042016-07-31
BPUB
2016-07-052016-08-15
PPUB
2016-07-212016-09-15

Project

IEC 60749-44 Ed. 1.0

Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron beam irradiated single event effect (SEE) test method for semiconductor devices

 

Remark:

Change of target date for ADIS to 2015-12 based on decision taken at TC 47 meeting in Minsk, Belarus on 2015-10-09. Functions concerned - Safety, EMC, Quality assurance. Project plan - CDV: 2013-07, FDIS: 2015-04 Liaison - JEDEC/EIA and JEITA.