International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Dr J. Lynch | ANW | 2015-09 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2012-04-20 | ||||
| ANW |
| 2012-10-02 | 2012-09-15 | |||
| 1CD | 2013-08-31 | |||||
332 kBProject
IEC 60749-44 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 44: Neutron irradiated soft error test method for semiconductor devices with memory
Remark:
Project plan - CDV: 2013-07, FDIS: 2015-04 Liaison - JEDEC/EIA and JEITA