International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Dr. J. Lynch | ANW | 2015-07 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||
|---|---|---|---|---|---|---|
| PNW |
| 2011-12-14 | ||||
| ANW |
| 2012-07-27 | 2012-04-30 | |||
| 1CD | 2013-05-31 | |||||
546 kBProject
IEC 60749-43 Ed. 1.0
Semiconductor devices - mechanical and climatic test methods - Part 43: Guidelines for LSI reliability qualification plans
Remark:
Project plan - CDV: 2014-05, FDIS: 2015-02 Liaison - JEDEC, JEITA Need for co-ordination: IEC TC91 WG3