International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Dr. J. Lynch | CCDV | 2014-04 | 2017 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2012-01-03 | ||||||
| ANW |
| 2012-04-20 | 2012-05-31 | |||||
| 1CD |
| 2012-04-30 | 2012-04-30 | |||||
| CDM |
| 2012-10-02 | ||||||
| ACDV |
| 2013-01-04 | 2012-11-30 | |||||
| CCDV |
| 2013-03-13 | 2013-03-31 | |||||
| ADIS | 2013-09-15 | |||||||
| DEC | 2013-10-15 | |||||||
289 kB
109 kBProject
IEC 60749-42 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage
Remark:
Function concerned - Environment. Project plan - CDV: 2013-03, FDIS: 2014-01 Liaison - JEDEC/EIA and JEITA Need for co-ordination within IEC - TC 91