International
Electrotechnical
Commission
International Standards and Conformity Assessment
for all electrical, electronic and related technologies
TC 47 |
Semiconductor devices |
Detail
Committee | Working Groups | Project Leader | Current Status | Frcst Pub Date | Stability Date |
|---|---|---|---|---|---|
| TC 47 | 02 | Jim Lynch | ACDV | 2014-07 | 2017 |
History
Stage | Document | Downloads | Decision Date | Target Date | ||||
|---|---|---|---|---|---|---|---|---|
| PNW |
| 2010-11-12 | ||||||
| ANW |
| 2011-09-16 | ||||||
| 1CD |
| 2012-03-02 | 2012-02-28 | |||||
| CDM |
| 2012-10-02 | ||||||
| ACDV |
| 2012-12-17 | 2012-11-30 | |||||
| CCDV | 2013-03-31 | |||||||
393 kB
214 kBProject
IEC 60749-28 Ed. 1.0
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing Direct contact charged device model (DC-CDM)
Remark:
Function concerned - Environment Project plan - CDV: 2013-02, FDIS: 2014-02 Relationship of project: This project may involve co-operation with JEDEC/EIA, ESDA and JEITA Liaison organizations: JEDEC/EIA, ESDA and JEITA Need for coordination within ISO or IEC: This project will be progressed with the full and active collaboration of TC101 WG6 Originally released as 60749-28 f1 Ed.1